Zobrazeno 1 - 10
of 33
pro vyhledávání: '"Marion Kelsch"'
Autor:
Dan Zhou, Wilfried Sigle, Eiji Okunishi, Yi Wang, Marion Kelsch, Hanns-Ulrich Habermeier, Peter A. van Aken
Publikováno v:
APL Materials, Vol 2, Iss 12, Pp 127301-127301-10 (2014)
We studied ZrO2 − La2/3Sr1/3MnO3 pillar–matrix thin films which were found to show anomalous magnetic and electron transport properties. With the application of an aberration-corrected transmission electron microscope, interfacial chemistry, and
Externí odkaz:
https://doaj.org/article/c14e2915890a47e39b05a2626a7be4bf
Publikováno v:
Journal of Applied Physics
This work investigates the conductivity and structure of nanocrystalline CaF2 films grown at 200 °C by thermal evaporation. The in-plane conductivity is enhanced by several orders of magnitude compared to lightly doped bulk samples of CaF2, which in
Publikováno v:
ACS Applied Materials & Interfaces. 8:24177-24185
The availability of aberration correctors for the probe-forming lenses makes simultaneous modification and characterization of materials down to atomic scale inside a transmission electron microscopy (TEM) realizable. In this work, we report on the e
Publikováno v:
Advanced Functional Materials. 23:1798-1806
One-dimensional defects are created in [001] and [110] oriented TiO2 single crystals by uniaxial pressure. Transmission electron microscopy (TEM) characterization shows them to preferably lie on {110} planes. Electrical properties studied as a functi
Publikováno v:
Nano Letters
We demonstrate that the growth of F16CuPc 1-D nanostructures can be directed by templates of gold nanoparticles. The growth occurs via vapor-phase transport, whereby the gold nanoparticles act as nucleation sites for F16CuPc molecules and promote the
Autor:
A. Gerlach, N. Kasper, Frank Schreiber, Bruno Gompf, Matthias Fischer, Jens Pflaum, S. Sellner, Marion Kelsch, Helmut Dosch, Gerhard Ulbricht, Stephan Meyer
Publikováno v:
Journal of Materials Research. 21:455-464
We present a detailed study of the thermal stability of organic thin films of diindenoperylene encapsulated by sputtered aluminum oxide layers. We studied the influence of capping layer thickness, stoichiometry, and heating rate on the thermal stabil
Autor:
Marion Kelsch, S. Sellner, Helmut Dosch, Jens Pflaum, Alexander Gerlach, Matthias Fischer, N. Kasper, Frank Schreiber, Stephan Meyer, Bruno Gompf
Publikováno v:
Advanced Materials. 16:1750-1753
We show that the thermal stability of thin films of the organic semiconductor diindenoperylene (DIP) can be strongly enhanced by aluminum oxide capping layers. By thermal desorption spectroscopy and in-situ X-ray diffraction we demonstrate that organ
Publikováno v:
Microscopy and Microanalysis. 22:1824-1825
Publikováno v:
Ultramicroscopy. 98:51-55
We present a route for the preparation of cross-sectional TEM specimens of crystalline organic thin films which minimizes the mechanical, chemical and thermal load of the organic film during preparation and allows to take TEM images with molecular re
Autor:
Helmut Kronmüller, Tsung-Shune Chin, T. Drogen, Yeong-Der Yao, Marion Kelsch, Jai-Lin Tsai, A. Melsheimer, S. Fisher
Publikováno v:
Physica B: Condensed Matter. 327:283-286
Multi-layer [(NdFeB)x/(Nb)z]n films with 200 nm⩾x⩾10 nm, 10 nm⩾z⩾0, 40⩾n⩾2, prepared by ion beam sputtering and subsequent annealing, show significantly enhanced coercivity due to the reduced grain size that enhances the anisotropy of ind