Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Mario García Valderas"'
Publikováno v:
Sensors, Vol 22, Iss 10, p 3950 (2022)
The market of wearable devices has been growing over the past decades. Smart wearables are usually part of IoT (Internet of things) systems and include many functionalities such as physiological sensors, processing units and wireless communications,
Externí odkaz:
https://doaj.org/article/aca2b865d0ed40f296a2dade5d29edf8
Autor:
Luis Ángel García Astudillo, ALMUDENA LINDOSO, Luis Entrena, HONORIO MARTIN, PEDRO MARTÍN-HOLGADO, Mario García Valderas
Publikováno v:
IEEE Transactions on Nuclear Science. 69:1485-1491
Reduced precision redundancy (RPR) is an alternative to triple modular redundancy (TMR) that reduces the area overhead at the expense of minor accuracy loss in case of error. In this work, we propose a Scaled RPR approach for multistage circuits and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::416268fdff999e14b61109adef3e8b97
https://doi.org/10.1109/tns.2022.3147599
https://doi.org/10.1109/tns.2022.3147599
Autor:
Luis Ángel García Astudillo, ALMUDENA LINDOSO, Luis Entrena, HONORIO MARTIN, PEDRO MARTÍN-HOLGADO, Mario García Valderas
Publikováno v:
Digital.CSIC. Repositorio Institucional del CSIC
instname
instname
This work analyzes the performance of the reduced precision redundancy (RPR) error mitigation technique using the fast Fourier transform (FFT) as a case study. To this purpose, several configurations of an FFT IP design were implemented in field-prog
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c83b3d995e72150f1b05ce204d908248
http://hdl.handle.net/10261/278073
http://hdl.handle.net/10261/278073
Autor:
ALMUDENA LINDOSO, JOSE A. BELLOCH, José Badía, Luis Entrena, Yolanda Morilla, Germán León, Mario García Valderas
Publikováno v:
Repositori Universitat Jaume I
Universitat Jaume I
Universitat Jaume I
Graphic processing units (GPUs) have become a basic accelerator both in high-performance nodes and low-power system-on-chip (SoC). They provide massive data parallelism and very high performance per watt. However, their reliability in harsh environme
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::376b182a6a282951377cb033d68f264d
http://hdl.handle.net/10261/287723
http://hdl.handle.net/10261/287723
Autor:
Luis A. García-Astudillo, Almudena Lindoso, Luis Entrena, Honorio Martín, Mario García-Valderas, Pedro Martín-Holgado, Yolanda Morilla
Publikováno v:
IEEE Transactions on Nuclear Science. :1-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f56c9efbed59a8423e5a96e24f9c2371
https://doi.org/10.1109/tns.2023.3268825
https://doi.org/10.1109/tns.2023.3268825
Publikováno v:
2007 IEEE International Symposium on Industrial Electronics.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bb908758189121544bb5e68b8e789f4d
https://doi.org/10.1109/isie.2007.4374557
https://doi.org/10.1109/isie.2007.4374557
Autor:
Mario García Valderas, Luis Entrena, Raúl Fernández Cardenal, Celia López Ongil, Marta Portela García
Publikováno v:
Journal of Electronic Testing; Feb2009, Vol. 25 Issue 1, p107-116, 10p