Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Marijn van Veghel"'
In the WR network, a dedicated time and frequency system is set up to deliver and distribute the time signal from WR switches or WR nodes locally. Accordingly, the design of a flexible, transferrable, and extensible time and frequency system is requi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::99fad921ff9862ed8d82a554ea987aba
https://doi.org/10.36227/techrxiv.17122154
https://doi.org/10.36227/techrxiv.17122154
Autor:
Paul-Eric Pottie, Carsten Rieck, Marijn Van Veghel, Massari Maurizio, Javier Diaz, Adam Parsons, Francois Kecskemeti, Peter Jansweijer, C. Langham, Y. Xie, Jose Lopez-Jimenez, Hermann Virgile, Elizabeth Laier English, Erik Dierikx, Sapia Adalberto, Luca Liberati, Belinda Eglin, José Luis Gutiérrez, Anders Wallin, Davide Calonico, Peter Whibberley
Publikováno v:
Proceedings of the 52nd Annual Precise Time and Time Interval Systems and Applications Meeting.
Time and frequency dissemination for industrial applications is still predominantly realised through radio signals and satellite time broadcasting, such as the widely used Global Positioning System (GPS). However, the weak signal power received on Ea
Autor:
Marijn van Veghel, Samriddh Sharma, Zander Marais, Ronald van Leeuwen, Dennis Hoogenboom, Gert Rietveld, Helko van den Brom
This paper describes present research towards improved standardization of static electricity meter testing with conducted electromagnetic interference (EMI). The latest experiences distilled from this research are presented regarding waveform capturi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ba7aa6c8a6642569caf8d7cfcd2bb744
https://doi.org/10.36227/techrxiv.13469622.v1
https://doi.org/10.36227/techrxiv.13469622.v1
Autor:
Steven van den Berg, Paul Dekker, Gianluca Casarosa, Marijn van Veghel, Ramon Vink, Omar El Gawhary, Steven Sablerolle
Publikováno v:
International Conference on Space Optics — ICSO 2018.
In this contribution we present a method to calibrate a radiometer at high irradiance levels (18 kW/m2). The method has been developed in the frame of the ESA Technology Research Programme. The radiometer under test is used as a reference detector in
Publikováno v:
Microelectronic Engineering. 153:29-36
Calibration of the lateral scale of scanning probe microscopes using conventional physical calibration standards (i.e. 1D or 2D gratings) has limitations for small scanning ranges imposed by the pitch of the standards. Below approximately 1µm the nu
Autor:
Pepijn Kenter, Elena Revtova, Ramon Vink, Omar El Gawhary, Dominic Doyle, Marijn van Veghel, André Trarbach, Maurice Heemskerk, Paul Dekker, Natasja van der Leden
Publikováno v:
International Conference on Space Optics — ICSO 2014.
We present a portable traceability solution for the ground-based optical calibration of earth observation (EO) instruments. Currently, traceability for this type of calibration is typically based on spectral irradiance sources (e.g. FEL lamps) calibr
Publikováno v:
Microelectronic Engineering. 141:250-255
Display Omitted A simple surface profile for the areal surface texture parameter Sq was developed.The implementation of a virtual standard to generate the surface profile was demonstrated.Accurate calibration of the virtual standard was presented. As
Autor:
R. J. E. Merry, Mustafa Uyanik, M Maarten Steinbuch, Marijn van Veghel, Richard Koops, René van de Molengraft
Publikováno v:
Asian Journal of Control, 11(2), 130-143. National Taiwan University (IEEB)
Atomic Force Microscopes (AFMs) are widely used for the investigation of samples at the nanometer scale. The metrological AFM used in this work uses a 3 degrees-of-freedom (DOFs) stage, driven by piezo-stack actuators, for sample manipulation in comb
Autor:
Bernd Bodermann, Egbert Buhr, Hans-Ulrich Danzebrink, Markus Bär, Frank Scholze, Michael Krumrey, Matthias Wurm, Petr Klapetek, Poul-Erik Hansen, Virpi Korpelainen, Marijn van Veghel, Andrew Yacoot, Samuli Siitonen, Omar El Gawhary, Sven Burger, Toni Saastamoinen, David G. Seiler, Alain C. Diebold, Robert McDonald, Amal Chabli, Erik M. Secula
Publikováno v:
AIP Conference Proceedings 1395: Frontiers of Characterization and Metrology for Nanoelectronics: 2011, Grenoble, France, 23-26 May 2011
Supported by the European Commission and EURAMET, a consortium of 10 participants from national metrology institutes, universities and companies has started a joint research project with the aim of overcoming current challenges in optical scatteromet
Autor:
Mustafa Uyanik, Richard Koops, R. J. E. Merry, M Maarten Steinbuch, Marijn van Veghel, René van de Molengraft
Publikováno v:
Proceedings of the 28th American Control Conference, (ACC '09) 10-12 June 2009, St. Louis, MO, USA, 967-972
STARTPAGE=967;ENDPAGE=972;TITLE=Proceedings of the 28th American Control Conference, (ACC '09) 10-12 June 2009, St. Louis, MO, USA
ACC
STARTPAGE=967;ENDPAGE=972;TITLE=Proceedings of the 28th American Control Conference, (ACC '09) 10-12 June 2009, St. Louis, MO, USA
ACC
The manipulation of samples in atomic force microscopes (AFMs) is often performed using piezoelectric actuators. In this paper, a metrological AFM with a 3 degree-of-freedom (DOF) stage driven by piezo-stack actuators is considered. The piezo actuato
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f0087048ab3f7a4eb9e10b31b41dfa9b
https://doi.org/10.1109/ACC.2009.5160007
https://doi.org/10.1109/ACC.2009.5160007