Zobrazeno 1 - 1
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pro vyhledávání: '"Marian Jamrich"'
Publikováno v:
Czechoslovak Journal of Physics. 43:723-731
A new computer controlled equipment for carrier concentration profile determination of silicon structures by a spreading resistance technique is presented. The required data and plots can easily be obtained by means of a new software package, which h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e7184e788b432f0a7562d0359721b7c
https://doi.org/10.1007/bf01607584
https://doi.org/10.1007/bf01607584
