Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Mariam G. Sadaka"'
Autor:
Antonio A. Garcia, Mariam G. Sadaka
Publikováno v:
Chemical Engineering Communications. 173:91-102
Solvent extraction using an extractant/diluent system was evaluated for the recovery of shikimic and quinic acids. Tridodecylamine (TDA) was used as the extractant, and 1-heptanol as the diluent. TDA complexes with the acid resulting in an acid-amine
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48d21b9a57770d40cdda8cdcc8c51d6f
https://doi.org/10.1080/00986449908912778
https://doi.org/10.1080/00986449908912778
Autor:
Antonio A. Garcia, Mariam G. Sadaka
Publikováno v:
Separation Science and Technology. 33:1667-1680
Forward extraction of shikimic and quinic acids with tridodecylamine (TDA)/1-heptanol is favored at low temperature. In back extraction, higher temperatures and the addition of oleic acid as a competitive displacer provided 80% recovery for shikimic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6fa3b75fe33a98ef085e4cfe7cee84b3
https://doi.org/10.1080/01496399808545072
https://doi.org/10.1080/01496399808545072
Autor:
P. Savary, G. Montoriol, F. Clayton, B. Thibaud, V. Esnault, E. Yu, M. Tutt, A. Mitra, D. Hill, A. Girardot, R. Uscola, A. Reyes, K. Rajagopalan, L. Cornibert, H. Henry, C. Rampley, M. Majerus, F. Dupis, Mariam G. Sadaka, S. Klingbeil, O. Izumi, L. Chapoux, R. Jaoui
Publikováno v:
GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 23rd Annual Technical Digest 2001 (Cat. No.01CH37191).
A heterojunction bipolar transistor (HBT) technology utilizing InGaP/GaAs and carbon-doped base has been established in Motorola's high-volume 6" GaAs facility. The technology has been used to develop an integrated dual band (824-849 MHz and 1850-191
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0c61013b6e1f774edb45fff3762a853a
https://doi.org/10.1109/gaas.2001.964349
https://doi.org/10.1109/gaas.2001.964349
Autor:
Darrell G. Hill, H. Henry, Manoj Nair, Scott Kiefer, S. Mitra, Mariam G. Sadaka, Paul W. Sanders, M. Sutton, Syd R. Wilson, John W. Steele
Publikováno v:
International Symposium for Testing and Failure Analysis.
Visible to infra-red photon emissions can be readily observed in compound semiconductor devices through the semi-insullating substrate and are useful in fault identification when analyzing yield problems. The techniques described here have uncovered
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::049a3f974859e62ad8ce72d7ee946416
https://doi.org/10.31399/asm.cp.istfa2002p0173
https://doi.org/10.31399/asm.cp.istfa2002p0173
Autor:
Sadaka, Mariam G., Garcia, Antonio A.
Publikováno v:
Separation Science & Technology; Jan1998, Vol. 33 Issue 11, p1667-1680, 14p