Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Marek Korzybski"'
Publikováno v:
International Journal of Electronics and Telecommunications, Vol vol. 67, Iss No 3, Pp 531-536 (2021)
This paper is focused on multiple soft fault diagnosis of linear time-invariant analog circuits and brings a method that achieves all objectives of the fault diagnosis: detection, location, and identification. The method is based on a diagnostic test
Externí odkaz:
https://doaj.org/article/0480d4a899d748feb94ce6b7852bd26e
Autor:
Marek Ossowski, Marek Korzybski
Publikováno v:
National Information Processing Institute
The paper is devoted to diagnostic method enabling us to perform all the three levels of fault investigations, it means, detection, localization and identification. It is designed for analog diode-transistor circuits, in which the circuit state is de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::75bad9187d8d0e1f731de60925cca6e0
https://doi.org/10.1515/eletel-2015-0014
https://doi.org/10.1515/eletel-2015-0014
Publikováno v:
International Journal of Circuit Theory and Applications. 40:1041-1052
This paper deals with the diagnosis of multiple catastrophic faults, being cuts (open-circuits) of some connecting paths and/or short-circuits of some pairs of points in analog circuits. A method enabling us to detect and identify the faults, taking
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bc4b9f6135e6222c879bc97847c995fe
https://doi.org/10.1002/cta.770
https://doi.org/10.1002/cta.770
Autor:
Michał Tadeusiewicz, Marek Korzybski
Publikováno v:
International Journal of Circuit Theory and Applications. 28:245-262
A method for fault location and parameter identification in linear AC and DC circuits with limited accessible terminals for excitation and measurement is developed in this paper. Fault location is based on a derived relationship having a general mean
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ab8e6a1ba9435654bf1ad90cb491b60
https://doi.org/10.1002/(sici)1097-007x(200005/06)28:3<245::aid-cta103>3.0.co
https://doi.org/10.1002/(sici)1097-007x(200005/06)28:3<245::aid-cta103>3.0.co
Autor:
M. Ossowski, Marek Korzybski
Publikováno v:
Publons
This paper describes two different methods of improving the ranking list algorithm for catastrophic faults localization method. First one, based on the simulated annealing and the genetic algorithm approach, enables us to search in very large set of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f3526d6b8b33d8659f2ef43ff4d73d41
https://doi.org/10.1109/icses.2012.6382247
https://doi.org/10.1109/icses.2012.6382247
Autor:
Marek Korzybski
Publikováno v:
2008 International Conference on Signals and Electronic Systems.
In this paper a new method for detection, location and identification of multiple soft and catastrophic faults in linear and nonlinear analog circuits is described. It is based on the node approach and two evolutionary methods: gene expression progra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b471103b87f2c9011590a791ae98f2e5
https://doi.org/10.1109/icses.2008.4673495
https://doi.org/10.1109/icses.2008.4673495
Autor:
Marek Korzybski, Marek Ossowski
Publikováno v:
Scopus-Elsevier
National Information Processing Institute
National Information Processing Institute
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::753ce901fe6f1b361f6e84e632be7b34
http://www.scopus.com/inward/record.url?eid=2-s2.0-58449126876&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-58449126876&partnerID=MN8TOARS
Autor:
Marek Korzybski, Ossowski, M.
Publikováno v:
Scopus-Elsevier
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::31642bbde1ee087c1923100acf1f1a80
http://www.scopus.com/inward/record.url?eid=2-s2.0-81155139189&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-81155139189&partnerID=MN8TOARS
Autor:
Tadeusiewicz, Michał1 michal.tadeusiewicz@p.lodz.pl, Ossowski, Marek1 marek.ossowski@p.lodz.pl, Korzybski, Marek1 marek.korzybski@p.lodz.pl
Publikováno v:
International Journal of Electronics & Telecommunications. 2021, Vol. 67 Issue 3, p531-536. 6p.
Autor:
Korzybski, Marek1, Ossowski, Marek1
Publikováno v:
International Journal of Electronics & Telecommunications. Mar2015, Vol. 61 Issue 1, p109-115. 7p.