Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Marcus Turowski"'
Autor:
Thomas Köhler, Henrik Ehlers, Detlev Ristau, Dennis Franke, Christian Hettich, Thomas Frauenheim, Marcus Turowski
Publikováno v:
Physical Review B. 98
This work presents both the parametrization procedure of a self-consistent charge density functional based tight-binding scheme (SCC-DFTB) for hafnium oxide and the structural as well as the electronic results of the simulations of amorphous hafnium
Publikováno v:
SPIE Proceedings.
A multiple scale model approach is presented in order to investigate Al2O3 thin film growth in the framework of an existing Ion Beam Sputtering (IBS) coating process. Therefore, several simulation techniques are combined via optimized interfaces for
Autor:
Thomas Melzig, Stéphane Lucas, Marco Jupé, Detlev Ristau, Pavel Moskovkin, Alain Daniel, Andreas Pflug, Marcus Turowski
Simulation of the coating process is a very promising approach for the understanding of thin film formation. Nevertheless, this complex matter cannot be covered by a single simulation technique. To consider all mechanisms and processes influencing th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ddf89c569cc5e78679a6fcd4e7ebfaf2
https://publica.fraunhofer.de/handle/publica/240769
https://publica.fraunhofer.de/handle/publica/240769
Publikováno v:
Applied optics. 53(4)
The electronic and optical properties of TiO2 atomic structures representing simulated thin films have been investigated using density functional theory. Suitable model parameters and system sizes have been identified in advance by validation of the
Publikováno v:
Optical Interference Coatings.
Classical molecular dynamics techniques are used for modeling Al2O3 thin film growth according to modern ion coating processes. Results for surface roughness and film density dependent on deposition energy are presented.
Publikováno v:
Optical Interference Coatings.
We simulate electronic and optical properties of TiO2 structures representing films with different densities. We calculate dependencies of bandgap and refractive index on film density. The observed dependencies are consistent with experimental data.
Autor:
Steffen Wilbrandt, Andreas Ohl, Olaf Stenzel, Thomas Köhler, Rüdiger Foest, Peter Awakowicz, Ilona Rolfes, Detlev Ristau, Carsten Schmitz, Grygoriy Dolgonos, Ralf Peter Brinkmann, Marcus Turowski, Norbert Kaiser, Thomas Musch, Thomas Frauenheim, Hartmut Steffen
Publikováno v:
SPIE Proceedings.
The PluTO project is aimed at combining thin-film and plasma technologies. Accordingly, the consortium comprises experts in optical coating (Laser Zentrum Hannover, Fraunhofer IOF) and such in plasma technology (INP Greifswald, Ruhr University of Boc
Publikováno v:
SPIE Proceedings.
In order to determine the current status of thin film laser resistance within the private, academic, and government sectors, a damage competition was started at the 2008 Boulder Damage Symposium. This damage competition allows a direct comparison of
Publikováno v:
Journal of Physics D: Applied Physics. 46:325302
We have investigated the structural and electronic properties of amorphous TiO2 using molecular dynamics (MD) simulations based on ab initio density functional theory, a numerically efficient density-functional-based tight-binding approach and classi
Publikováno v:
Scopus-Elsevier
A multiple scale model named virtual coater is applied to investigate in the layer properties of growing films in dependence of PVD process conditions. Results for density, roughness, stress, and index of refraction are presented.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5118947a2195e5b1726566c9e4cd24df
http://www.scopus.com/inward/record.url?eid=2-s2.0-85019517840&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-85019517840&partnerID=MN8TOARS