Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Marcus Straw"'
Autor:
Jing Wang, Steven Randolph, Qian Wu, Aurélien Botman, Jenna Schardt, Cedric Bouchet-Marquis, Xiaolin Nan, Chad Rue, Marcus Straw
Publikováno v:
Scientific Reports, Vol 11, Iss 1, Pp 1-15 (2021)
Abstract Correlative light and electron microscopy (CLEM) is a powerful tool for defining the ultrastructural context of molecularly-labeled biological specimens, particularly when superresolution fluorescence microscopy (SRM) is used for CLEM. Curre
Externí odkaz:
https://doaj.org/article/f0f6efc485d1402bbb08fea2a56e7570
Autor:
Sejeong Kim, Johannes E. Fröch, Joe Christian, Marcus Straw, James Bishop, Daniel Totonjian, Kenji Watanabe, Takashi Taniguchi, Milos Toth, Igor Aharonovich
Publikováno v:
Nature Communications, Vol 9, Iss 1, Pp 1-8 (2018)
Hexagonal boron nitride (hBN) is a layered van der Waals material showing promise for nanophotonics. Here, the authors design hBN photonic crystal cavities with quality factors exceeding 2000, and further demonstrate deterministic tuning of individua
Externí odkaz:
https://doaj.org/article/8e346a3d5edb43f5bf9e714e523343a5
Autor:
Cedric Bouchet-Marquis, Xiaolin Nan, Steven Randolph, Aurelien Botman, Marcus Straw, Jenna Schardt, Jing Wang, Chad Rue, Qian Wu
Publikováno v:
Scientific Reports
Scientific Reports, Vol 11, Iss 1, Pp 1-15 (2021)
Scientific Reports, Vol 11, Iss 1, Pp 1-15 (2021)
Correlative light and electron microscopy (CLEM) is a powerful tool for defining the ultrastructural context of molecularly-labeled biological specimens, particularly when superresolution fluorescence microscopy (SRM) is used for CLEM. Current CLEM,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::319c16f38dbbbb0a2c8bcfd324372f95
https://doi.org/10.1038/s41598-021-92608-y
https://doi.org/10.1038/s41598-021-92608-y
Publikováno v:
Acta Materialia. 124:37-46
A femtosecond Ti:sapphire laser was used to ablate samples of copper, strontium titanate (STO), a nickel alloy Rene 88DT (R88), {111}-oriented single crystal silicon, and gallium nitride (GaN) in situ in a focused ion beam scanning electron microscop
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::278ecb26cdce6d77637388f74f89f609
https://doi.org/10.1016/j.actamat.2016.10.055
https://doi.org/10.1016/j.actamat.2016.10.055
Autor:
Andrew T. Polonsky, Steven Randolph, McLean P. Echlin, Jorge Filevich, Marcus Straw, Chris J. Torbet, Michael S. Titus, Tresa M. Pollock, Aurelien Botman, Alessandro Mottura, W. C. Lenthe, Remco Geurts, Toby Francis
Publikováno v:
Microscopy and Microanalysis. 26:2624-2625
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b837eaef8b2682df20fef7033a011258
https://doi.org/10.1017/s1431927620022229
https://doi.org/10.1017/s1431927620022229
Publikováno v:
Materials Characterization. 100:1-12
Femtosecond laser ablation offers the unique ability to remove material at rates that are orders of magnitude faster than existing ion beam technologies with little or no associated damage. By combining ultrafast lasers with state-of-the-art electron
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf8b58906355d8acb3b42a7f3d282790
https://doi.org/10.1016/j.matchar.2014.10.023
https://doi.org/10.1016/j.matchar.2014.10.023
Autor:
Milos Toth, Jorge Filevich, Igor Aharonovich, Steven Randolph, Aiden A. Martin, Aurelien Botman, Marcus Straw
Publikováno v:
ACS applied materialsinterfaces. 9(45)
© 2017 American Chemical Society. Ultra-nanocrystalline diamond (UNCD) is increasingly being used in the fabrication of devices and coatings due to its excellent tribological properties, corrosion resistance, and biocompatibility. Here, we study its
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::32c43229c5fdf73de45d8141bc06d294
https://pubmed.ncbi.nlm.nih.gov/29058873
https://pubmed.ncbi.nlm.nih.gov/29058873
Publikováno v:
Journal of Vacuum Science & Technology B. 36:06JB01
The authors have developed a system combining a 220 fs pulse focused laser beam operating at 1030 or 515 nm, a Xe+ plasma source focused ion beam, and a Schottky source focused electron beam, all coincident at the sample. They present on results and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a61539318300cbb0536b935dc630410
https://doi.org/10.1116/1.5047806
https://doi.org/10.1116/1.5047806
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20(2)
The introduction of gases, such as water vapor, into an environmental scanning electron microscope is common practice to assist in the imaging of insulating or biological materials. However, this capability may also be exploited to introduce, or form
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::833d3388df267983ab6810dc1f67fef7
https://pubmed.ncbi.nlm.nih.gov/24589298
https://pubmed.ncbi.nlm.nih.gov/24589298