Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Marcos Fernando Odorczyk"'
Autor:
Joel Stryhalski, Luis César Fontana, Marcos Fernando Odorczyk, Juliano Sadi Scholtz, Julio César Sagás, Abel André Candido Recco
Publikováno v:
Materials Research, Vol 17, Iss 6, Pp 1545-1549 (2014)
This paper reports the effect of pulsed bias in comparison with DC bias on reactive deposition of Ti6Al4V-N films, obtained by Grid Assisted Magnetron Sputtering. The results obtained by X-Ray diffraction (XRD), Energy Dispersive X-ray Fluorescence S
Externí odkaz:
https://doaj.org/article/c72dcca524024b279b7cbab126e08514
Autor:
Abel André Candido Recco, Luis Cesar Fontana, Juliano Sadi Scholtz, Joel Stryhalski, Marcos Fernando Odorczyk, J.C. Sagás
Publikováno v:
Materials Research v.17 n.6 2014
Materials research (São Carlos. Online)
Universidade Federal de São Carlos (UFSCAR)
instacron:ABM ABC ABPOL
Materials Research, Vol 17, Iss 6, Pp 1545-1549 (2014)
Materials Research, Volume: 17, Issue: 6, Pages: 1545-1549, Published: DEC 2014
Materials research (São Carlos. Online)
Universidade Federal de São Carlos (UFSCAR)
instacron:ABM ABC ABPOL
Materials Research, Vol 17, Iss 6, Pp 1545-1549 (2014)
Materials Research, Volume: 17, Issue: 6, Pages: 1545-1549, Published: DEC 2014
This paper reports the effect of pulsed bias in comparison with DC bias on reactive deposition of Ti6Al4V-N films, obtained by Grid Assisted Magnetron Sputtering. The results obtained by X-Ray diffraction (XRD), Energy Dispersive X-ray Fluorescence S
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3e1a5ff31c5188ca1ceca3f9735f57b1
https://doi.org/10.1590/1516-1439.271314
https://doi.org/10.1590/1516-1439.271314