Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Marco O. Sanchez"'
Publikováno v:
International Symposium for Testing and Failure Analysis.
In this paper, we describe a modified soft defect localization (SDL) technique, PSDL (pseudo-soft defect localization), to localize pseudo-soft defects in integrated circuits (ICs). Similar to soft defects, functional failures due to pseudo-soft defe
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detec