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pro vyhledávání: '"Marco Di Bernardo"'
Autor:
Yevhen Nikitin, Annette Muetze, Roland Sleik, Klaus Krischan, Marco Di Bernardo, Michael Glavanovics
Publikováno v:
2017 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe).
Today, performing life tests on power semiconductor devices is of major importance in industrial and automotive power applications. Traditionally, qualification tests, like the HTOL test, are carried out in a semi-automated manner. This paper first r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::556f05e1d5129324afe36b36e8a0a2e5
https://doi.org/10.23919/epe17ecceeurope.2017.8098933
https://doi.org/10.23919/epe17ecceeurope.2017.8098933
