Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Marcelo Soares Lubaszewski"'
Autor:
Daniela Francisco Brauner, Fernanda Maciel Reichert, Raquel Janissek-Muniz, Aurora Carneiro Zen, Daniela Callegaro de Menezes, Lisiane Quadrado Closs, Wendy Beatriz Witt Haddad Carraro, Carla Simone Ruppenthal, Fernanda Maria Müller, Marcelo Soares Lubaszewski, Marisa Ignez S. Rhoden
Publikováno v:
RAE: Revista de Administração de Empresas, Vol 60, Iss 6, Pp 437-450 (2020)
The economic effects of isolation policies resulting from the COVID-19 pandemic have led small and medium-sized enterprises (SMEs) to look for alternatives to survive. Within this crisis scenario, an engaged university has an important role to play i
Externí odkaz:
https://doaj.org/article/0a76b6264f68479da413f4fae8637ac8
Autor:
Daniela Francisco Brauner, Fernanda Maciel Reichert, Raquel Janissek-Muniz, Aurora Carneiro Zen, Daniela Callegaro de Menezes, Lisiane Quadrado Closs, Wendy Beatriz Witt Haddad Carraro, Carla Simone Ruppenthal, Fernanda Maria Müller, Marcelo Soares Lubaszewski, Marisa Ignez S. Rhoden
Publikováno v:
RAE: Revista de Administração de Empresas, Vol 60, Iss 6 (2020)
Efeitos econômicos das políticas de isolamento da pandemia da Covid-19 levaram pequenas e médias empresas (PMEs) a buscar alternativas para sobreviver. Em cenários de crise, uma universidade engajada tem um papel importante ao abordar não apenas
Externí odkaz:
https://doaj.org/article/4db5ef3632b34574b4e47dd171a32ee5
This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to
Publikováno v:
Reliability, Availability and Serviceability of Networks-on-Chip ISBN: 9781461407904
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::43d3ef8a6b884f81ba14ebc1940f9e1b
https://doi.org/10.1007/978-1-4614-0791-1_1
https://doi.org/10.1007/978-1-4614-0791-1_1
Publikováno v:
Reliability, Availability and Serviceability of Networks-on-Chip ISBN: 9781461407904
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ab3485f0b505e40f2382e79bc969011
https://doi.org/10.1007/978-1-4614-0791-1_10
https://doi.org/10.1007/978-1-4614-0791-1_10
Publikováno v:
Reliability, Availability and Serviceability of Networks-on-Chip ISBN: 9781461407904
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bdd0721728797eb49d347cee3b71367e
https://doi.org/10.1007/978-1-4614-0791-1_2
https://doi.org/10.1007/978-1-4614-0791-1_2
Publikováno v:
ISVLSI
In this work the problem of single event upset (SEU) is considered to a new analog technology: the field programmable analog arrays (FPAAs). Some FPAA models are based on SRAM memory cells to implement the user programmability. For this reason, such
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d1abc19d077ceeb6a635da7a8173d17
https://doi.org/10.1109/isvlsi.2007.91
https://doi.org/10.1109/isvlsi.2007.91
Autor:
Erika Cota, Marcelo Soares Lubaszewski, Alexandre M. Amory, Fernanda Lima Kastensmidt, Paulo Meirelles, M. Cassel
Publikováno v:
ITC
An extended fault model and novel strategy to tackle interconnect faults in network-on-chips are proposed. Short faults between distinct channels are considered in a cost-effective test sequence for mesh NoC topologies based on XY routing.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eb3255331d836dd559dadc93a6a49356
https://doi.org/10.1109/test.2007.4437574
https://doi.org/10.1109/test.2007.4437574
Publikováno v:
SBCCI
This paper proposes a test planning method capable of reusing available processors as test sources and sinks, and the on-chip network as the access mechanism for the test of cores embedded into a system on chip. The resulting test time of the system
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3465dc522eb96a92647a0fe9529ddafd
https://doi.org/10.1145/1016568.1016602
https://doi.org/10.1145/1016568.1016602