Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Marc Schouten"'
Publikováno v:
Solar Energy Materials and Solar Cells. 173:6-11
Measuring the external quantum efficiency (EQE) of a solar cell is a standard method to gain deeper insights into its opto-electrical properties. For the case of crystalline silicon solar cells, the EQE of a solar cell is often used to assess the qua
Autor:
Bart Macco, Miro Zeman, Arno H. M. Smets, H. Schut, Stephan W. H. Eijt, A. Mannheim, Marc Schouten, Albert S. Vullers, Jimmy Melskens
Publikováno v:
IEEE Journal of Photovoltaics, 7(2):7828138, 421-429. IEEE Electron Devices Society
IEEE Journal of Photovoltaics, 7(2)
IEEE Journal of Photovoltaics, 7(2)
The nanostructure of hydrogenated amorphous silicon (a-Si:H) is studied by means of doppler broadening positron annihilation spectroscopy (DB-PAS) and Fourier transform infrared (FTIR) spectroscopy. The evolution of open volume deficiencies is monito
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::82cb05d943ff965cfbcc22694625a03b
https://research.tue.nl/nl/publications/ee0bc411-a550-4790-bde6-3785a3e713c8
https://research.tue.nl/nl/publications/ee0bc411-a550-4790-bde6-3785a3e713c8
Autor:
Miro Zeman, Arno H. M. Smets, Takuya Matsui, Marc Schouten, H. Schut, Albert S. Vullers, Jimmy Melskens, Yalda Mohammadian, Stephan W. H. Eijt, A. Mannheim
Publikováno v:
IEEE Journal of Photovoltaics. 4:1331-1336
The nature and the kinetics of light-induced defect creation in hydrogenated amorphous silicon (a-Si:H) films and so- lar cells are investigated by means of Doppler broadening positron annihilation spectroscopy, Fourier transform photocurrent spec- t
Autor:
Marinus Fischer, Miro Zeman, Ravi Vasudevan, D.J. van der Vlies, Valeria Demontis, Jimmy Melskens, Arno H. M. Smets, Marc Schouten, S.G.M. Heirman, Rudi Santbergen, Klaus Jäger, Robin J. V. Quax
Publikováno v:
Solar Energy Materials and Solar Cells. 129:70-81
A profound comprehension of the nanostructure of hydrogenated amorphous silicon (a-Si:H) and the defect states in this material is currently still lacking despite several decades of research on this topic. Investigating the nature of defects in a-Si:
Publikováno v:
2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2.
Temperature annealing is used as a tool to study the validity of network models for the nanostructure of hydrogenated amorphous silicon (a-Si:H) and its relation to defect states. The changes in the size of the dominant open volume deficiencies have