Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Marc Huppmann"'
Publikováno v:
2022 IEEE International Test Conference (ITC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::782182ceaa4661991414fdcee6fbf827
https://doi.org/10.1109/itc50671.2022.00072
https://doi.org/10.1109/itc50671.2022.00072
Publikováno v:
2022 IEEE International Test Conference India (ITC India).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::060a1dc18b1ba3cc683221f078efdeae
https://doi.org/10.1109/itcindia202255192.2022.9854542
https://doi.org/10.1109/itcindia202255192.2022.9854542
Publikováno v:
2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9bf87474f278111da457edf967e567de
https://doi.org/10.1109/icecs53924.2021.9665466
https://doi.org/10.1109/icecs53924.2021.9665466
Publikováno v:
2021 International Semiconductor Conference (CAS).
Parameter extraction is a challenging task, as it searches for a solution inside a high dimensional plus non-convex space. To be able to apply well known gradient based optimizers, the problem is dissected into multiple simpler yet intertwined tasks,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3021967a708f7e8f1911bbe2a9ee907e
https://doi.org/10.1109/cas52836.2021.9604125
https://doi.org/10.1109/cas52836.2021.9604125