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pro vyhledávání: '"Marc Dagan"'
Autor:
Scott Pearson, Paul Collanton, Tirthajyoti Sarkar, Marc Dagan, James Victory, Cristian Andreev, Xiao Yunpeng, Ashok Challa
Publikováno v:
2019 IEEE Applied Power Electronics Conference and Exposition (APEC).
This paper proposes a novel physical approach to corner and statistical SPICE model generation for Shielded-Gate Trench Power MOSFETs. The technique is derived from the mature IC industry standard approach known as Backward Propagation of Variance. P
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c64fdd5719913cfbc208f1fb68486b99
https://doi.org/10.1109/apec.2019.8722168
https://doi.org/10.1109/apec.2019.8722168
