Zobrazeno 1 - 10
of 43
pro vyhledávání: '"Mao‐Chou Tai"'
Autor:
Ya-Ting Chien, Kuan-Ju Zhou, Mao-Chou Tai, Yu-An Chen, Pei-Jun Sun, Ya-Huan Lee, Ting-Chang Chang, Tsung-Ming Tsai, Yang-Shun Fan, Chen-Shuo Huang, Kuo-Kuang Chen, Chih-Hung Tsai
Publikováno v:
IEEE Transactions on Electron Devices. 70:1089-1094
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::47e9fec6a491fdf20a8d5d89fdc94949
https://doi.org/10.1109/ted.2023.3237506
https://doi.org/10.1109/ted.2023.3237506
Autor:
Kuan-Ju Zhou, Ting-Chang Chang, Mao-Chou Tai, Yu-An Chen, Ya-Ting Chien, Pei-Jun Sun, Po-Yu Yen, Simon M. Sze, Yang-Shun Fan, Chen-Shuo Huang, Kuo-Kuang Chen, Chih-Hung Tsai
Publikováno v:
ACS Applied Electronic Materials. 5:1183-1188
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1bde9fadc6a1766a4c108283cb4b1dd4
https://doi.org/10.1021/acsaelm.2c01629
https://doi.org/10.1021/acsaelm.2c01629
Autor:
Wei-Chun Hung, Yu-Fa Tu, Ting-Chang Chang, Mao-Chou Tai, Kuan-Hsu Chen, Fu-Yuan Jin, Chien-Hung Yeh, Wei-Chieh Hung, Chin-Han Chang, Hung-Ming Kuo, Chen-Hsin Lien
Publikováno v:
IEEE Transactions on Electron Devices. :1-5
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4604ca04fb88426433f6a8c8110bdb6
https://doi.org/10.1109/ted.2023.3276734
https://doi.org/10.1109/ted.2023.3276734
Autor:
Bo-Shen Huang, Ting-Chang Chang, Mao-Chou Tai, Han-Yu Chang, Kuan-Ju Zhou, Li-Chuan Sun, Jen-Wei Huang, Ming-Chen Chen, Hui-Chun Huang
Publikováno v:
IEEE Transactions on Electron Devices. 69:4288-4292
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cc33b907c751529daf7c0f49e175cd86
https://doi.org/10.1109/ted.2022.3184907
https://doi.org/10.1109/ted.2022.3184907
Publikováno v:
2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5af2027c272a232febec6c2b48f77572
https://doi.org/10.1109/vlsi-tsa/vlsi-dat57221.2023.10134354
https://doi.org/10.1109/vlsi-tsa/vlsi-dat57221.2023.10134354
Autor:
Kai-Chun Chang, Po-Hsun Chen, Ting-Chang Chang, Yung-Fang Tan, Wen-Chung Chen, Chien-Hung Yeh, Fong-Min Ciou, Mao-Chou Tai, Tsung-Ming Tsai, Simon Sze
Publikováno v:
IEEE Electron Device Letters. 43:862-865
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3966845c3aa5051c729da3bb409f47d1
https://doi.org/10.1109/led.2022.3166180
https://doi.org/10.1109/led.2022.3166180
Autor:
Hong-Yi Tu, Ting-Chang Chang, Yu-Ching Tsao, Mao-Chou Tai, Yu-Zhe Zheng, Yu-Fa Tu, Chuan-Wei Kuo, Chia-Chuan Wu, Yu-Lin Tsai, Tsung-Ming Tsai, Chih-Chih Lin, Ya-Ting Chien
Publikováno v:
IEEE Electron Device Letters. 43:721-724
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1f88d251e3142a9b57be8309db0b88f6
https://doi.org/10.1109/led.2022.3159585
https://doi.org/10.1109/led.2022.3159585
Autor:
Wei-Chun Hung, Yu-Fa Tu, Ting-Chang Chang, Mao-Chou Tai, Yung-Fang Tan, Kuan-Hsu Chen, Chien-Hung Yeh, Hong-Yi Tu, Hung-Ming Kuo
Publikováno v:
IEEE Electron Device Letters. 43:769-772
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::73eb2619fc9c5d5476b4bff7a8cd65bd
https://doi.org/10.1109/led.2022.3164475
https://doi.org/10.1109/led.2022.3164475
Autor:
Kuan-Ju Zhou, Yu-Zhe Zheng, Mao-Chou Tai, Po-Hsun Chen, Yang-Hao Hung, Yu-Fa Tu, Jian-Jie Chen, Wei-Chun Hung, Yu-Xuan Wang, Ya-Ting Chien, Pei-Jun Sun, Hui-Chun Huang, Ting-Chang Chang
Publikováno v:
IEEE Electron Device Letters. 43:576-579
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e42d2e2c4bd795a1499635e6e57480f5
https://doi.org/10.1109/led.2022.3151530
https://doi.org/10.1109/led.2022.3151530
Autor:
Yu-Xuan Wang, Ting-Chang Chang, Mao-Chou Tai, Chia-Chuan Wu, Yu-Zhe Zheng, Yu-Fa Tu, Jian-Jie Chen, Kuan-Ju Zhou, Yu-Shan Shih, Yu-An Chen, Jen-Wei Huang, Simon Sze
Publikováno v:
IEEE Transactions on Electron Devices. 69:1532-1537
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c8df4c61931d90b61a639dc756095851
https://doi.org/10.1109/ted.2022.3140691
https://doi.org/10.1109/ted.2022.3140691