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Quantum metrology employs entanglement to enhance measurement precision. The focus and progress so far have primarily centered on estimating a single parameter. In diverse application scenarios, the estimation of more than one single parameter is oft
Externí odkaz:
http://arxiv.org/abs/2312.10480
Publikováno v:
Metallurgical & Mining Industry; 2015, Issue 9, p316-323, 8p
