Zobrazeno 1 - 10
of 108
pro vyhledávání: '"Manuela Klaus"'
Autor:
José García, Maiara Moreno, Wei Wan, Daniel Apel, Haroldo Pinto, Matthias Meixner, Manuela Klaus, Christoph Genzel
Publikováno v:
Crystals, Vol 11, Iss 2, p 158 (2021)
The stress behavior and the associated microstructure evolution of industrial Ti(C,N)/α-Al2O3 coatings subjected to thermal cycling are investigated by in situ energy dispersive synchrotron X-ray diffraction and transmission electron microscopy. Tem
Externí odkaz:
https://doaj.org/article/3d5706a664d1423d93ef2f12104903f9
Autor:
Francisco García-Moreno, Laurenz Alexander Radtke, Tillmann Robert Neu, Paul Hans Kamm, Manuela Klaus, Christian Matthias Schlepütz, John Banhart
Publikováno v:
Metals, Vol 10, Iss 2, p 189 (2020)
The foaming behaviour of aluminium alloys processed by the powder compaction technique depends crucially on the exact alloy composition. The AlSi8Mg4 alloy has been in use for a decade now, and it has been claimed that this composition lies in an “
Externí odkaz:
https://doaj.org/article/067b7b0e996c46d1970742af1ef3e90b
Autor:
Manuela Klaus, Francisco Garcia-Moreno
Publikováno v:
Journal of large-scale research facilities JLSRF, Vol 2, p A40 (2016)
The materials science beamline EDDI is operated in the Energy Dispersive DIffraction mode and provides hard synchrotron X-rays in an energy range between about 8 … 150 keV for a multitude of experiments reaching from the in-situ study of thin film
Externí odkaz:
https://doaj.org/article/fb9e6ce6092e46af8ebd0c985f586a44
Publikováno v:
Genzel, C, Klaus, M, Hempel, N, Nitschke-Pagel, T & Pantleon, K 2023, ' Energy-dispersive X-ray stress analysis under geometric constraints: exploiting the material's inherent anisotropy ', Journal of Applied Crystallography, vol. 56, pp. 526-538 . https://doi.org/10.1107/S1600576723001759
Two data evaluation concepts for X-ray stress analysis based on energy-dispersive diffraction on polycrystalline materials with cubic crystal structure, almost random crystallographic texture and strong single-crystal elastic anisotropy are subjected
Publikováno v:
Journal of Applied Crystallography
Two data evaluation concepts are proposed for nondestructive and depth-resolved X-ray residual stress analysis by means of energy-dispersive diffraction on materials featuring cubic symmetry and a nearly single crystalline structure.
Two evaluat
Two evaluat
Publikováno v:
Journal of Applied Crystallography
Energy-dispersive diffraction is used for the nondestructive analysis of the hoop stress depth distribution at the inner surface of narrow boreholes. The results are corrected for the rotation effect, which is shown to have a significant influence on
Autor:
Oxana V. Magdysyuk, Štefan Michalik, Manuela Klaus, Wilson, Matthew C. Veale, Francisco García-Moreno, J.A. Nelson, Phoebe K. Allan, Paul H. Kamm, Thomas Connolley
Publikováno v:
Journal of Applied Crystallography
An experimental setup is described that uses a hyperspectral imaging detector to collect time-resolved X-ray diffraction information from a complete discharging AA size battery, using a commercial alkaline Zn–Mn cell as a proof of concept. The work
Autor:
Mirosław Wróbel, Manuela Klaus, Andrzej Baczmanski, Marianna Marciszko-Wiąckowska, Kamila Kollbek, Christoph Genzel, Sebastian Wroński, Adrian Oponowicz
Publikováno v:
Metallurgical and Materials Transactions A. 51:5945-5957
In this work, the stress gradient in mechanically polished tungsten sample was studied using X-ray diffraction methods. To determine in-depth stress evolution in the very shallow subsurface region (up to 10 μm), special methods based on reflection g
Autor:
Ilaria Roveda, Itziar Serrano-Munoz, Tatiana Mishurova, Mauro Madia, Thilo Pirling, Alexander Evans, Manuela Klaus, Jan Haubrich, Guillermo Requena, Giovanni Bruno
Publikováno v:
Journal of materials science 57(48), 22082-22098 (2022). doi:10.1007/s10853-022-07997-w
Journal of materials science 57(48), 22082-22098 (2022). doi:10.1007/s10853-022-07997-w
Published by Springer Science + Business Media B.V, Dordrecht [u.a.]
Published by Springer Science + Business Media B.V, Dordrecht [u.a.]
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fc44c308b64bbe2c0d8fba65b3924cca
Autor:
Manuela Klaus, Christoph Genzel
Publikováno v:
Journal of Applied Crystallography. 52:94-105
In this paper two evaluation methods for X-ray stress analysis by means of energy-dispersive diffraction are reassessed. Both are based on the sin2ψ measuring technique. Advantage is taken of the fact that the d ψ hkl –sin2ψ data obtained for th