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pro vyhledávání: '"Manuel Tomberger"'
Autor:
Giuseppe Iannaccone, Gianluca Fiori, Lauri Knuuttila, Manuel Tomberger, Luca Sayadi, Oliver Häberlen, Gilberto Curatola
Publikováno v:
IEEE Transactions on Electron Devices. 65:51-58
We present an investigation of vertical leakage in GaN-on-Si epitaxial stack through electrical characterization and device simulations. Different structures of increasing complexity have been fabricated and analyzed in order to achieve a complete un
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ee1a1c13df6a7e9dec238a993961f1ed
https://doi.org/10.1109/ted.2017.2773670
https://doi.org/10.1109/ted.2017.2773670
