Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Manuel Fregolent"'
Autor:
Manuel Fregolent, Mirco Boito, Michele Disaro, Carlo De Santi, Matteo Buffolo, Eleonora Canato, Michele Gallo, Cristina Miccoli, Isabella Rossetto, Giansalvo Pizzo, Alfio Russo, Ferdinando Iucolano, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 12, Pp 703-709 (2024)
For the first time, we use electrical characterization, spectrally-resolved electroluminescence measurements and degradation tests to explain the negative activation energy of gate reliability in power GaN HEMTs with p-GaN Schottky gate. First, the o
Externí odkaz:
https://doaj.org/article/15a4697f89804f29a689c0c64e591d90
Autor:
Manuel Fregolent, Alberto Marcuzzi, Carlo De Santi, Eldad Bahat Treidel, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Publikováno v:
2023 IEEE International Reliability Physics Symposium (IRPS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0c65928c4b4a4f41e2e44f41f7720ffe
https://doi.org/10.1109/irps48203.2023.10117719
https://doi.org/10.1109/irps48203.2023.10117719
Autor:
Nicola Roccato, Francesco Piva, Carlo De Santi, Matteo Buffolo, Manuel Fregolent, Marco Pilati, Norman Susilo, Daniel Hauer Vidal, Anton Muhin, Luca Sulmoni, Tim Wernicke, Michael Kneissl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
The long-term stability of ultraviolet (UV)-C light-emitting diodes (LEDs) is of major importance for many applications. To improve the understanding in this field, we analyzed the degradation of AlGaN-based UVC LEDs and modeled the variation of elec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dddf3fb3b79eb9d6c9baf65eab7e465d
https://hdl.handle.net/11577/3477948
https://hdl.handle.net/11577/3477948
Autor:
Carlo De Santi, Manuel Fregolent, Matteo Buffolo, Masataka Higashiwaki, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Publikováno v:
Oxide-based Materials and Devices XIII.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9ea891ead0a734992463ad28e14cc8e8
https://doi.org/10.1117/12.2607613
https://doi.org/10.1117/12.2607613
Autor:
Manuel Fregolent, Enrico Brusaterra, Carlo De Santi, Kornelius Tetzner, Joachim Würfl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Publikováno v:
Oxide-based Materials and Devices XIII.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d88a5d67d25b45bfcc1f46b0e54d1b08
https://doi.org/10.1117/12.2607362
https://doi.org/10.1117/12.2607362
Autor:
Manuel Fregolent, Matteo Buffolo, Carlo De Santi, Sho Hasegawa, Junta Matsumura, Hiroyuki Nishinaka, Masahiro Yoshimoto, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f3c2d0353a7876b7a19a7b1b2f476b08
http://hdl.handle.net/11577/3455308
http://hdl.handle.net/11577/3455308
Autor:
Thomas Bordignon, Manuel Fregolent, Carlo De Santi, Klaas Strempel, Andrey Bakin, Andreas Waag, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Publikováno v:
2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6b8a9f97729545c51e21f7ee588d747f
https://doi.org/10.1109/wipda49284.2021.9645108
https://doi.org/10.1109/wipda49284.2021.9645108
Autor:
Hiroyuki Nishinaka, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini, Manuel Fregolent, Junta Matsumura, Masahiro Yoshimoto, Matteo Buffolo, Sho Hasegawa, Carlo De Santi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::811aa771061abf2bffa2f13a408072df
http://hdl.handle.net/11577/3398484
http://hdl.handle.net/11577/3398484
Autor:
Manuel Fregolent, Carlo De Santi, Matteo Buffolo, Masataka Higashiwaki, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Publikováno v:
Journal of Applied Physics. 130:245704
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a35d1dc0d12a5be64fef25bbb6f17b52
https://doi.org/10.1063/5.0065434
https://doi.org/10.1063/5.0065434