Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Manuel Cabanas-Holmen"'
Autor:
Steven M. Guertin, Raphael Some, Patrick Nsengiyumva, Ethan H. Cannon, Manuel Cabanas-Holmen, Jon Ballast
Publikováno v:
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Publikováno v:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).
A full-custom SoC was fabricated in 32nm SOI CMOS for the monolithic signal digitization of the signal coming from a 16-channel antenna array. In particular, the chip included multiple 3-bit 32GSps ADCs with DLL for time interleaving, and one 2GSps D
Publikováno v:
IEEE Transactions on Nuclear Science. 62:1568-1576
This paper describes the ASIC Single Event Effects (SEE) Error Rate Tool (ASERT) methodology to estimate the error rates of complex System-on-Chip (SoC) devices. ASERT consists of a top-down analysis to divide the SoC into sensitive cell groups. The
Autor:
Manuel Cabanas-Holmen, Ethan H. Cannon, Joe Tostenrude, Roger Brees, Barry Meaker, Michael Carson, Charles Neathery
Publikováno v:
IEEE Transactions on Nuclear Science. 60:4207-4213
We describe a test structure architecture that allows at-speed Single Event Effects (SEE) testing on embedded memory arrays. The at-speed test structure enables identification of Multiple Cell Upsets (MCU), Multiple Bit Upsets (MBU), persistent error
Autor:
Salim A. Rabaa, Jon Ballast, Ethan H. Cannon, Michael Carson, Tony Amort, Roger Brees, Duncan Lam, Manuel Cabanas-Holmen
Publikováno v:
IEEE Transactions on Nuclear Science. 60:4374-4380
We introduce the 32 nm SOI Boeing Interleaved Flip-Flop, which is based on the DICE topology with additional RHBD layout enhancements. Sensitive node pairs were separated by interleaving elements of the flip-flop cell, to attain the required SEU perf
Publikováno v:
2016 IEEE Radiation Effects Data Workshop (REDW).
A Radiation-Hardened By Design 8-bit 32nm SOI CMOS pipeline ADC shows no AC performance nor non-linearity worsening vs. TID when operated at 200MSps sampling rate, -1dBFS sinewave input amplitude. The circuit shows no visible performance variation du
Autor:
Ethan H. Cannon, T. Swann, A. J. Kleinosowski, Tony Amort, Roger Brees, J. Wert, Manuel Cabanas-Holmen, S. Fischer, Jon Ballast, Barry Meaker
Publikováno v:
IEEE Transactions on Nuclear Science. 58:2726-2733
We describe the approach used to calculate and verify on-orbit upset rates of radiation hardened microprocessors. System designers use these error rates to choose between microprocessors and add appropriate system-level recovery and redundancy.
Autor:
A. J. Kleinosowski, Manuel Cabanas-Holmen, J. Killens, Jon Ballast, Ethan H. Cannon, J. Socha
Publikováno v:
IEEE Transactions on Nuclear Science. 56:3505-3510
A complex processor was synthesized using an RHBD cell library and fabricated in a commercial 90 nm CMOS technology. Single Event Effects testing revealed transients on the clock and global reset signals. These critical circuits will receive addition
Autor:
Roger Brees, Warren Snapp, Jon Ballast, Tony Amort, Manuel Cabanas-Holmen, Steve Fischer, Ethan H. Cannon, Charles Neathery
Publikováno v:
2015 IEEE Aerospace Conference.
This paper describes a method for developing Radiation Hardened by Design (RHBD) multicore processor Integrated Circuits (ICs) that meet specific single-event error rate targets in space environments with minimal impacts on power, area, and speed.
Autor:
Jerry Lee Wert, Manuel Cabanas-Holmen, Mark Joseph Clemen, Ethan H. Cannon, Bill Schasteen, Dennis A. Russell, Bill Bartholet, Jason Andrew Koehn
Publikováno v:
2012 IEEE Radiation Effects Data Workshop.
This paper describes the use of the BREL Dynamitron accelerator for low-energy (≤ 2MeV) single event effects testing of semiconductor devices. A description of the Dynamitron and test data shall be given.