Zobrazeno 1 - 10
of 73
pro vyhledávání: '"Mantilla JM"'
Autor:
Martínez-Zarzuelo A; Department of Sciences, Social Sciences and Mathematics Education, Faculty of Education, Complutense University of Madrid, c/ Rector Royo Villanova, 1, 28040, Madrid, Spain. Electronic address: angelica.martinez@ucm.es., Rodríguez-Mantilla JM; Department of Research and Psychology in Education, Faculty of Education, Complutense University of Madrid, c/ Rector Royo Villanova, 1, 28040, Madrid, Spain. Electronic address: jesusmro@ucm.es., Fernández-Díaz MJ; Department of Research and Psychology in Education, Faculty of Education, Complutense University of Madrid, c/ Rector Royo Villanova, 1, 28040, Madrid, Spain. Electronic address: mjfdiaz@ucm.es.
Publikováno v:
Evaluation and program planning [Eval Program Plann] 2022 Oct; Vol. 94, pp. 102119. Date of Electronic Publication: 2022 Jun 23.
Autor:
Rodríguez-Mantilla JM; Depto. de Investigación y Psicología en Educación, Facultad de Educación, Universidad Complutense de Madrid, C\ Rector Royo Villanova, s/n 28040, Madrid, Spain. Electronic address: jesusmro@ucm.es., Martínez-Zarzuelo A; Depto. de Didáctica de Ciencias Experimentales, Sociales y Matemáticas, Facultad de Educación, Universidad Complutense de Madrid, C\ Rector Royo Villanova, s/n 28040, Madrid, Spain. Electronic address: angelica.martinez@ucm.es., Fernández-Cruz FJ; Depto. de Investigación y Psicología en Educación, Facultad de Educación, Universidad Complutense de Madrid, C\ Rector Royo Villanova, s/n 28040, Madrid, Spain. Electronic address: fjfernandezcruz@ucm.es.
Publikováno v:
Evaluation and program planning [Eval Program Plann] 2020 Mar 02; Vol. 80, pp. 101816. Date of Electronic Publication: 2020 Mar 02.
Autor:
Idoiaga Mondragon, Nahia1, Beloki, Nekane2, Yarritu, Ion1 ion.yarritu@ehu.es, Zarrazquin, Idoia3, Artano, Karmele4
Publikováno v:
Higher Education (00181560). Sep2024, Vol. 88 Issue 3, p919-937. 19p.
Autor:
Iqbal, Shahzaf1 (AUTHOR) shahzafiqbal@yahoo.com, Hanif, Dr. Mubashir2 (AUTHOR) shahzafiqbal@yahoo.com, Khan, Dr. Sohaib3 (AUTHOR)
Publikováno v:
PLoS ONE. 7/9/2024, Vol. 19 Issue 7, p1-16. 16p.
Autor:
Fernández-Díaz MJ; Complutense University of Madrid, C/Rector Royo Villanova s/n, Ciudad Universitaria, 28040, Madrid, Spain. Electronic address: mjfdiaz@ucm.es., Rodríguez-Mantilla JM; Complutense University of Madrid, C/Rector Royo Villanova s/n, Ciudad Universitaria, 28040, Madrid, Spain. Electronic address: jesusmro@ucm.es., Jover-Olmeda G; Complutense University of Madrid, C/Rector Royo Villanova s/n, Ciudad Universitaria, 28040, Madrid, Spain. Electronic address: gjover@ucm.es.
Publikováno v:
Evaluation and program planning [Eval Program Plann] 2017 Aug; Vol. 63, pp. 116-122. Date of Electronic Publication: 2017 Apr 27.
Autor:
Rodríguez-Mantilla JM; Universidad Complutense de Madrid., Fernández-Díaz MJ
Publikováno v:
Psicothema [Psicothema] 2017 Aug; Vol. 29 (3), pp. 370-377.
Autor:
Woolliams ER; National Physical Laboratory (NPL), Hampton Road, Teddington TW11 0LW, UK emma.woolliams@npl.co.uk., Anhalt K; Physikalisch-Technische Bundesanstalt (PTB), Abbestrasse 2-12, Berlin 10587, Germany., Ballico M; Temperature Standards, National Measurement Institute Australia (NMIA), Bradfield Road, West Lindfield, New South Wales 2070, Australia., Bloembergen P; Research Institute for Physical Measurement, National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan Division of Thermophysics and Process Measurements, National Institute of Metrology (NIM), No. 18 Bei San Huan Dong Lu, Beijing 100029, People's Republic of China., Bourson F; High Temperature Metrology Department, Laboratoire commun de métrologie (LNE-Cnam), 61 rue du Landy, Saint Denis 93210, France., Briaudeau S; High Temperature Metrology Department, Laboratoire commun de métrologie (LNE-Cnam), 61 rue du Landy, Saint Denis 93210, France., Campos J; Optical Institute, Spanish National Research Council (CSIC), Serrano, 144, Madrid 28006, Spain., Cox MG; National Physical Laboratory (NPL), Hampton Road, Teddington TW11 0LW, UK., del Campo D; Centro Español de Metrologia, C/del Alfar, 2, Tres Cantos 28760, Spain., Dong W; Division of Thermophysics and Process Measurements, National Institute of Metrology (NIM), No. 18 Bei San Huan Dong Lu, Beijing 100029, People's Republic of China., Dury MR; National Physical Laboratory (NPL), Hampton Road, Teddington TW11 0LW, UK., Gavrilov V; All-Russian Research Institute for Optical and Physical Measurements (VNIIOFI), Ozernaya 46, Moscow 119361, Russia., Grigoryeva I; All-Russian Research Institute for Optical and Physical Measurements (VNIIOFI), Ozernaya 46, Moscow 119361, Russia., Hernanz ML; Optical Institute, Spanish National Research Council (CSIC), Serrano, 144, Madrid 28006, Spain., Jahan F; Temperature Standards, National Measurement Institute Australia (NMIA), Bradfield Road, West Lindfield, New South Wales 2070, Australia., Khlevnoy B; All-Russian Research Institute for Optical and Physical Measurements (VNIIOFI), Ozernaya 46, Moscow 119361, Russia., Khromchenko V; Sensor Science Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899, USA., Lowe DH; National Physical Laboratory (NPL), Hampton Road, Teddington TW11 0LW, UK., Lu X; Division of Thermophysics and Process Measurements, National Institute of Metrology (NIM), No. 18 Bei San Huan Dong Lu, Beijing 100029, People's Republic of China., Machin G; National Physical Laboratory (NPL), Hampton Road, Teddington TW11 0LW, UK., Mantilla JM; Centro Español de Metrologia, C/del Alfar, 2, Tres Cantos 28760, Spain., Martin MJ; Centro Español de Metrologia, C/del Alfar, 2, Tres Cantos 28760, Spain., McEvoy HC; National Physical Laboratory (NPL), Hampton Road, Teddington TW11 0LW, UK., Rougié B; High Temperature Metrology Department, Laboratoire commun de métrologie (LNE-Cnam), 61 rue du Landy, Saint Denis 93210, France., Sadli M; High Temperature Metrology Department, Laboratoire commun de métrologie (LNE-Cnam), 61 rue du Landy, Saint Denis 93210, France., Salim SG; High Temperature Metrology Department, Laboratoire commun de métrologie (LNE-Cnam), 61 rue du Landy, Saint Denis 93210, France Radiometry and Photometry Division, National Institute of Standards (NIS), PO Box 136, President Sadat Street, El-Haram, Giza, Egypt., Sasajima N; Research Institute for Physical Measurement, National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan., Taubert DR; Physikalisch-Technische Bundesanstalt (PTB), Abbestrasse 2-12, Berlin 10587, Germany., Todd AD; National Research Council Canada, 1200 Montreal Road, Ottawa, Ontario K1A 0R6, Canada., Van den Bossche R; National Physical Laboratory (NPL), Hampton Road, Teddington TW11 0LW, UK Department of Physics, University of Surrey, Guildford, Surrey GU2 7XH, UK., van der Ham E; Temperature Standards, National Measurement Institute Australia (NMIA), Bradfield Road, West Lindfield, New South Wales 2070, Australia., Wang T; Division of Thermophysics and Process Measurements, National Institute of Metrology (NIM), No. 18 Bei San Huan Dong Lu, Beijing 100029, People's Republic of China., Whittam A; National Physical Laboratory (NPL), Hampton Road, Teddington TW11 0LW, UK., Wilthan B; Physikalisch-Technische Bundesanstalt (PTB), Abbestrasse 2-12, Berlin 10587, Germany., Woods DJ; National Research Council Canada, 1200 Montreal Road, Ottawa, Ontario K1A 0R6, Canada., Woodward JT; Sensor Science Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899, USA., Yamada Y; Research Institute for Physical Measurement, National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan., Yamaguchi Y; Research Institute for Physical Measurement, National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan., Yoon HW; Sensor Science Division, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899, USA., Yuan Z; Division of Thermophysics and Process Measurements, National Institute of Metrology (NIM), No. 18 Bei San Huan Dong Lu, Beijing 100029, People's Republic of China.
Publikováno v:
Philosophical transactions. Series A, Mathematical, physical, and engineering sciences [Philos Trans A Math Phys Eng Sci] 2016 Mar 28; Vol. 374 (2064), pp. 20150044.
Autor:
Mubarok, M. Khusni1 mrchusny@gmail.com, Rofiah, Zakiatur1 zakiaturrofiah313@gmail.com
Publikováno v:
International Journal of Social Service & Research (IJSSR). 2023, Vol. 3 Issue 10, p2650-2661. 12p.
Autor:
Rodríguez Mantilla JM; Universidad Camilo José Cela, Dpto. de Educación, C/Pericles 28, 5o Dcha, 28011 Madrid, Spain. jmrodriguez@ucjc.edu, Fernández Díaz MJ
Publikováno v:
The Spanish journal of psychology [Span J Psychol] 2012 Nov; Vol. 15 (3), pp. 1456-65.
Autor:
Hong, Xiang1 (AUTHOR), Zhao, Fanqi1 (AUTHOR), Wang, Wei1 (AUTHOR), Wu, Jingying1 (AUTHOR), Zhu, Xiaoqi1 (AUTHOR), Wang, Bei1 (AUTHOR) wangbeilxb@163.com
Publikováno v:
Scientific Reports. 5/11/2023, Vol. 13 Issue 1, p1-8. 8p.