Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Mankoo Lee"'
Publikováno v:
Journal of the Korean Society of Radiology. 6:447-454
To examine the performance of a diagnostic X-ray system, we tes ted a linearity, reproducibility, and Half Value Layer(HVL). The linearity was examined 4 times of irradia tion with a given condition, and we recorded a level of radiation. We then calc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::387e9f077605ccd1547a9537b29985b8
https://doi.org/10.7742/jksr.2012.6.6.447
https://doi.org/10.7742/jksr.2012.6.6.447
Autor:
Zudian Qin, Mankoo Lee, S. D. Simeonov, K. El Sayed, I. Avci, Yong-Seog Oh, Pratheep Balasingam, Dipu Pramanik
Publikováno v:
2013 IEEE International Reliability Physics Symposium (IRPS).
A physically based simulation methodology provides fast and practical EM lifetime prediction. We identified an “EM-aware” region to define the length dependence of Cu-lines under high current stress. For eventual calibration of 2× nm node Cu-lin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::267088c8c04e5a02dab0cc8c102269f1
https://doi.org/10.1109/irps.2013.6532079
https://doi.org/10.1109/irps.2013.6532079
Publikováno v:
MRS Proceedings. 1559
We describe a mass transport TCAD simulation by using a Sentaurus S-Interconnect tool [1] that models reported electro-migration (EM) behaviors: EM induced resistance (R) change, line length (L) effect, and temperature (T) dependency on L and current
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::db932805057bb3e1415c20d4b108164d
https://doi.org/10.1557/opl.2013.870
https://doi.org/10.1557/opl.2013.870
Publikováno v:
MRS Proceedings. 1447
To understand paths towards higher efficiency (η) for copper-indium-gallium-(sulfur)-selenide [CIG(S)Se] solar cells, we investigated a variety of absorber composition grading schemes for various back-side gallium (Ga), front-side sulfur (S), and do
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::58ad411a4027e15e31b4e2b4c9138d55
https://doi.org/10.1557/opl.2012.1167
https://doi.org/10.1557/opl.2012.1167
Autor:
Mankoo Lee
Publikováno v:
1996 IEEE International Symposium on Circuits and Systems. Circuits and Systems Connecting the World. ISCAS 96.
We have developed a fringing and coupling interconnect line capacitance model for accurate circuit simulations, which includes the nonlinearities of second-order effects with field interactions among interconnects. Five actual cases of different surr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2dc4e72ce5d28348a57335a52b860f13
https://doi.org/10.1109/iscas.1996.541943
https://doi.org/10.1109/iscas.1996.541943
Publikováno v:
ISCAS
The thin film transistor (TFT) cell stability has been investigated by simulating Static Noise Margin (SNM) and Soft-Error Rate (SER) of a 4 Mbit SRAM which features a symmetrical spilt word-line bit cell in a double metal, quadruple poly 0.35 /spl m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f67ec97b23aca20c11266fdcac7195a2
https://doi.org/10.1109/iscas.1995.519919
https://doi.org/10.1109/iscas.1995.519919
Publikováno v:
Proceedings of ISCAS'95 - International Symposium on Circuits & Systems; 1995, Issue 2, p937-937, 1p
Autor:
Mankoo Lee
Publikováno v:
1996 IEEE International Symposium on Circuits & Systems Circuits & Systems Connecting the World ISCAS 96; 1996, Issue 4, p233-233, 1p
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Conference
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