Zobrazeno 1 - 10
of 125
pro vyhledávání: '"Manic, I."'
Autor:
Stojadinović, N., Djorić-Veljković, S., Davidović, V., Golubović, S., Stanković, S., Prijić, A., Prijić, Z., Manić, I., Danković, D.
Publikováno v:
In Microelectronics Reliability September 2018 88-90:135-141
Autor:
Danković, D., Manić, I., Prijić, A., Davidović, V., Prijić, Z., Golubović, S., Djorić-Veljković, S., Paskaleva, A., Spassov, D., Stojadinović, N.
Publikováno v:
In Microelectronics Reliability March 2018 82:28-36
Publikováno v:
In Microelectronic Engineering March 2011 88(3):305-313
Autor:
Danković, D., Manić, I., Djorić-Veljković, S., Davidović, V., Golubović, S., Stojadinović, N.
Publikováno v:
In Microelectronics Reliability 2006 46(9):1828-1833
Autor:
Stojadinović, N., Danković, D., Djorić-Veljković, S., Davidović, V., Manić, I., Golubović, S.
Publikováno v:
In Microelectronics Reliability 2005 45(9):1343-1348
Autor:
Stojadinovic, N. *, Manic, I., Davidovic, V., Dankovic, D., Djoric-Veljkovic, S., Golubovic, S., Dimitrijev, S.
Publikováno v:
In Microelectronics Reliability 2005 45(1):115-122
Publikováno v:
In Microelectronics Reliability 2003 43(9):1455-1460
Publikováno v:
In Microelectronics Journal November 2002 33(11):899-905
Autor:
Stojadinovic, N., Manic, I., Djoric-Veljkovic, S., Davidovic, V., Dankovic, D., Golubovic, S., Dimitrijev, S.
Publikováno v:
In Microelectronics Reliability 2002 42(9):1465-1468
Autor:
Stojadinovic, N., Manic, I., Djoric-Veljkovic, S., Davidovic, V., Golubovic, S., Dimitrijev, S.
Publikováno v:
In Microelectronics Reliability 2002 42(4):669-677