Zobrazeno 1 - 10
of 23
pro vyhledávání: '"Maneesh Kumar Pandey"'
Publikováno v:
Journal of New Economy, Vol 23, Iss 1, Pp 43-65 (2022)
Women account for almost half of the world population, however, their contribution to the economic development is rather limited due to significant gender imparity manifested in different aspects: from participation in decision-making and employment
Externí odkaz:
https://doaj.org/article/de1c8f2a199342d28fb5a5f036ff2c09
Publikováno v:
RUDN Journal of Economics, Vol 29, Iss 2, Pp 278-298 (2021)
The year 2020, so far, has been relentlessly wreaking havoc on the very concept of life and work as we know them. This unprecedented event has been unfolding multiple worst-case scenarios on all fronts of our society and has eclipsed almost every oth
Externí odkaz:
https://doaj.org/article/92b76c46121e4085ad46c78eadf985c1
Publikováno v:
Vestnik of Samara University. Economics and Management. 14:87-98
One of the top trending areas of research and development in science and technology is green technological innovation. Its primary objective is to develop a sustainable innovation paradigm that would allow for the introduction and development of envi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::32610a68bb824ebccc1a7e3c0d10639c
https://doi.org/10.18287/2542-0461-2023-14-1-87-98
https://doi.org/10.18287/2542-0461-2023-14-1-87-98
Autor:
Maneesh Kumar Pandey, Anton Potsulin
Publikováno v:
World of Economics and Management. 22:147-164
Artificial Intelligence (AI) is a term shaped by socio-behavioural rationales of human capabilities. AI is broadly characterized by a suite of technologies and capabilities, which are largely autonomous and predictive. Expectations of AI are derived
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c99cf29a6d78b55d16526f13fd2e9ff8
https://doi.org/10.25205/2542-0429-2022-22-1-147-164
https://doi.org/10.25205/2542-0429-2022-22-1-147-164
Publikováno v:
RUDN Journal of Economics, Vol 29, Iss 2, Pp 278-298 (2021)
The year 2020, so far, has been relentlessly wreaking havoc on the very concept of life and work as we know them. This unprecedented event has been unfolding multiple worst-case scenarios on all fronts of our society and has eclipsed almost every oth
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6ead6b81d4265b33ede00a62d81e6e7c
http://journals.rudn.ru/economics/article/viewFile/26890/19568
http://journals.rudn.ru/economics/article/viewFile/26890/19568
Publikováno v:
2021 IEEE 30th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2b83f5456cabe8cdf91933071b0efd95
https://doi.org/10.1109/epeps51341.2021.9609118
https://doi.org/10.1109/epeps51341.2021.9609118
Publikováno v:
3rd International Scientific Conference on Innovations in Digital Economy.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::65e484a8e18fa500aaa2892551f08c1b
https://doi.org/10.1145/3527049.3527099
https://doi.org/10.1145/3527049.3527099
Publikováno v:
IEEE Design & Test. 36:48-56
Editor’s note: Single-source clocking is important for networked SoC architectures. This article discusses the validation challenges related to on-chip single-source clocking due to the distributed clocking trends of recent SoCs and proposes a new
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ecc582481f4b88b047262b6f5775efc7
https://doi.org/10.1109/mdat.2019.2910138
https://doi.org/10.1109/mdat.2019.2910138
Publikováno v:
International Journal of Current Microbiology and Applied Sciences. 6:1170-1179
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e0c621fddc34aab8d6121c35d71af04
https://doi.org/10.20546/ijcmas.2017.608.145
https://doi.org/10.20546/ijcmas.2017.608.145
Publikováno v:
2019 IEEE 21st Electronics Packaging Technology Conference (EPTC).
Quality and reliability are one of the crucial test features in post silicon validation which ensures the performance of flawless silicon production. This paper addresses the issue related to random clock valid failure of USB-PLL during the series of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e998c84b7e2f928094c288f9b46b2e80
https://doi.org/10.1109/eptc47984.2019.9026652
https://doi.org/10.1109/eptc47984.2019.9026652