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Transient X-Ray Absorption Near Edge Structure Spectroscopy Using Broadband Free-Electron Laser Pulses.

Autor: Juranić P; Paul Scherrer Institute, Forschungsstrasse 111, Villigen, 5232, Switzerland., Cirelli C; Paul Scherrer Institute, Forschungsstrasse 111, Villigen, 5232, Switzerland., Mamyrbayev T; XRnanotech GmbH, PSI, Forschungsstrasse 111, Villigen, 5232, Switzerland., Uemura Y; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany., Vila-Comamala J; Paul Scherrer Institute, Forschungsstrasse 111, Villigen, 5232, Switzerland., Lima FA; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany., Bacellar C; Paul Scherrer Institute, Forschungsstrasse 111, Villigen, 5232, Switzerland., Johnson PJM; Paul Scherrer Institute, Forschungsstrasse 111, Villigen, 5232, Switzerland., Prat E; Paul Scherrer Institute, Forschungsstrasse 111, Villigen, 5232, Switzerland., Reiche S; Paul Scherrer Institute, Forschungsstrasse 111, Villigen, 5232, Switzerland., Wach A; Paul Scherrer Institute, Forschungsstrasse 111, Villigen, 5232, Switzerland., Bykova I; Paul Scherrer Institute, Forschungsstrasse 111, Villigen, 5232, Switzerland., Kahraman A; Paul Scherrer Institute, Forschungsstrasse 111, Villigen, 5232, Switzerland., Kabanova V; Paul Scherrer Institute, Forschungsstrasse 111, Villigen, 5232, Switzerland., Milne C; European XFEL GmbH, Holzkoppel 4, 22869, Schenefeld, Germany., David C; Paul Scherrer Institute, Forschungsstrasse 111, Villigen, 5232, Switzerland.

Publikováno v: Small methods [Small Methods] 2024 Aug; Vol. 8 (8), pp. e2301328. Date of Electronic Publication: 2024 Mar 05.

Photon-shot-noise-limited transient absorption soft X-ray spectroscopy at the European XFEL.

Autor: Le Guyader L; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Eschenlohr A; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Beye M; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Schlotter W; Linear Coherent Light Source, SLAC National Accelerator Lab, 2575 Sand Hill Rd, Menlo Park, CA 94025, USA., Döring F; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland., Carinan C; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Hickin D; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Agarwal N; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Boeglin C; Université de Strasbourg, CNRS, Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504, F-67000 Strasbourg, France., Bovensiepen U; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Buck J; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Carley R; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Castoldi A; Politecnico di Milano, Dip. Elettronica, Informazione e Bioingegneria and INFN, Sezione di Milano, Milano, Italy., D'Elia A; IOM-CNR, Laboratorio Nazionale TASC, Basovizza SS-14, km 163.5, 34012 Trieste, Italy., Delitz JT; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Ehsan W; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Engel R; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Erdinger F; Institute for Computer Engineering, University of Heidelberg, Mannheim, Germany., Fangohr H; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Fischer P; Institute for Computer Engineering, University of Heidelberg, Mannheim, Germany., Fiorini C; Politecnico di Milano, Dip. Elettronica, Informazione e Bioingegneria and INFN, Sezione di Milano, Milano, Italy., Föhlisch A; Institute for Methods and Instrumentation for Synchrotron Radiation Research (PS-ISRR), Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (HZB), Albert-Einstein Straße 15, 12489 Berlin, Germany., Gelisio L; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Gensch M; Institute of Optical Sensor Systems, DLR (German Aerospace Center), Rutherfordstrasse 2, 12489 Berlin, Germany., Gerasimova N; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Gort R; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Hansen K; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Hauf S; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Izquierdo M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Jal E; Sorbonne Université, CNRS, Laboratoire de Chimie Physique-Matière et Rayonnement, LCPMR, 75005 Paris, France., Kamil E; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Karabekyan S; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Kluyver T; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Laarmann T; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Lojewski T; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Lomidze D; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Maffessanti S; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Mamyrbayev T; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland., Marcelli A; INFN - Laboratori Nazionali di Frascati, via Enrico Fermi 54, 00044 Frascati, Italy., Mercadier L; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Mercurio G; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Miedema PS; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Ollefs K; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Rossnagel K; Institute of Experimental and Applied Physics, Kiel University, 24098 Kiel, Germany., Rösner B; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland., Rothenbach N; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Samartsev A; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Schlappa J; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Setoodehnia K; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Sorin Chiuzbaian G; Sorbonne Université, CNRS, Laboratoire de Chimie Physique-Matière et Rayonnement, LCPMR, 75005 Paris, France., Spieker L; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Stamm C; Department of Materials, ETH Zürich, 8093 Zürich, Switzerland., Stellato F; Physics Department, University of Rome Tor Vergata and INFN-Sezione di Roma Tor Vergata, Via della Ricerca Scientifica 1, 00133 Roma, Italy., Techert S; Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany., Teichmann M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Turcato M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Van Kuiken B; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Wende H; Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University Duisburg-Essen, Lotharstrasse 1, 47057 Duisburg, Germany., Yaroslavtsev A; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Zhu J; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Molodtsov S; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., David C; Paul Scherrer Institute, 5232 Villigen PSI, Switzerland., Porro M; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany., Scherz A; European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Publikováno v: Journal of synchrotron radiation [J Synchrotron Radiat] 2023 Mar 01; Vol. 30 (Pt 2), pp. 284-300. Date of Electronic Publication: 2023 Feb 20.

Staircase array of inclined refractive multi-lenses for large field of view pixel super-resolution scanning transmission hard X-ray microscopy.

Autor: Mamyrbayev T; Institute of Microstructure Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Baden-Württemberg, Germany., Ikematsu K; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi 980-8577, Japan., Takano H; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi 980-8577, Japan., Wu Y; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi 980-8577, Japan., Kimura K; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi 980-8577, Japan., Doll P; Institute of Microstructure Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Baden-Württemberg, Germany., Last A; Institute of Microstructure Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Baden-Württemberg, Germany., Momose A; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi 980-8577, Japan., Meyer P; Institute of Microstructure Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Baden-Württemberg, Germany.

Publikováno v: Journal of synchrotron radiation [J Synchrotron Radiat] 2021 May 01; Vol. 28 (Pt 3), pp. 732-740. Date of Electronic Publication: 2021 Mar 12.

Super-Resolution Scanning Transmission X-Ray Imaging Using Single Biconcave Parabolic Refractive Lens Array.

Autor: Mamyrbayev T; Institute of Microstructure Technology, Karlsruhe Institute of Technology, Karlsruhe, Germany. talgat.mamyrbayev@kit.edu., Ikematsu K; Institute of Microstructure Technology, Karlsruhe Institute of Technology, Karlsruhe, Germany.; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan., Meyer P; Institute of Microstructure Technology, Karlsruhe Institute of Technology, Karlsruhe, Germany., Ershov A; Institute for Photon Science and Synchrotron Radiation, Karlsruhe Institute of Technology, Karlsruhe, Germany., Momose A; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan., Mohr J; Institute of Microstructure Technology, Karlsruhe Institute of Technology, Karlsruhe, Germany.

Publikováno v: Scientific reports [Sci Rep] 2019 Oct 07; Vol. 9 (1), pp. 14366. Date of Electronic Publication: 2019 Oct 07.