Zobrazeno 1 - 2
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pro vyhledávání: '"Mamatha Yakkegondi Virupakshappaa"'
Autor:
Reiner Schwab, Peter Baumgartner, Doris Schmitt-Landsiedel, Andreas Lachmann, Mamatha Yakkegondi Virupakshappaa, Georgios N. Panagopoulos, Leonhard Heis
Publikováno v:
2016 IEEE International Reliability Physics Symposium (IRPS).
This work presents a systematic approach to investigate transistor reliability at high frequencies with on-chip stress circuits. The problem of state-of-the art on-chip stress circuits is that the actual stress signal at the device cannot be verified
Autor:
Mamatha Yakkegondi Virupakshappaa, Peter Baumgartner, Georgos Panagopoulos, Leonhard Heiss, Doris Schmitt-Landsiedel, Andreas Lachmann, Reiner Schwab
Publikováno v:
2016 International Conference on Microelectronic Test Structures (ICMTS).
This work presents an improved methodology for CMOS RF reliability assessment with on-chip AC stress circuits. Compared to previous work high frequency stress signals are not only generated on-chip, but are also monitored by an on-chip oscilloscope (