Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Malgorzata Kopycinska-Müller"'
Autor:
Malgorzata Kopycinska-Müller, Luise Schreiber, Eric Schwarzer-Fischer, Anne Günther, Conner Phillips, Tassilo Moritz, Jörg Opitz, Yeong-Jin Choi, Hui-suk Yun
Publikováno v:
Materials, Vol 16, Iss 10, p 3607 (2023)
We propose the use of Optical Coherence Tomography (OCT) as a tool for the quality control of 3-D-printed ceramics. Test samples with premeditated defects, namely single- and two-component samples of zirconia, titania, and titanium suboxides, were pr
Externí odkaz:
https://doaj.org/article/643b33b338734e5cb41e37c640eb9e9e
Publikováno v:
Handbook of Nondestructive Evaluation 4.0 ISBN: 9783030482008
Handbook of Nondestructive Evaluation 4.0
Handbook of Nondestructive Evaluation 4.0
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d293d8620ff6190c91ffda73d0fd871b
https://doi.org/10.1007/978-3-030-73206-6_15
https://doi.org/10.1007/978-3-030-73206-6_15
Autor:
Kong Boon Yeap, Ehrenfried Zschech, Sven Niese, Ude D. Hangen, Claudio Zambaldi, René Hübner, Malgorzata Kopycinska-Müller
Publikováno v:
Philosophical Magazine. 92:3142-3157
The reduced modulus, E-R, of elastically anisotropic materials (Si, CaF2 and MgF2) was determined for sub-10 nm, several-10 nm and several-100 nm indentation depths, applying the Hertzian and Oliver-Pharr approaches. The E-R values determined for Si(
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3741b0706745f1a2fd9a8dd3648ef704
https://doi.org/10.1080/14786435.2012.669071
https://doi.org/10.1080/14786435.2012.669071
Publikováno v:
Advanced Engineering Materials. 13:312-318
The atomic force acoustic microscopy (AFAM) technique has been used to determine elastic properties of films with thicknesses decreasing from several hundreds of nanometers to several nanometers. It has been shown that metal films as thin as 50 nm ca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::77746e9ed8b6f002073e47faf1807f8a
https://doi.org/10.1002/adem.201000245
https://doi.org/10.1002/adem.201000245
Publikováno v:
Ultramicroscopy. 106:466-474
Stiffness-load curves obtained in quantitative atomic force acoustic microscopy (AFAM) measurements depend on both the elastic properties of the sample and the geometry of the atomic force microscope (AFM) tip. The geometry of silicon AFM tips change
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f16cb9457a1290b7a1c18c6babede06f
https://doi.org/10.1016/j.ultramic.2005.12.006
https://doi.org/10.1016/j.ultramic.2005.12.006
Publikováno v:
Advanced Engineering Materials. 7:713-718
We are developing metrology for rapid, quantitative assessment of elastic properties with nanoscale spatial resolution. Atomic force acoustic microscopy (AFAM) methods enable measurements of modulus at either a single point or as a map of local prope
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::32faa1e1231e225c513d105ea58537fe
https://doi.org/10.1002/adem.200500039
https://doi.org/10.1002/adem.200500039
Autor:
Bernd Köhler, Nataliya Kuzeyeva, Malgorzata Kopycinska-Müller, André Striegler, Klaus-Jurgen Wolter
Publikováno v:
2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013).
We have developed a methodology to determine local indentation modulus M for films with thickness ranging from several nanometers to several hundreds of nanometers with nano-scale lateral resolution. Our results obtained for silicon oxide as well as
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82eba966f58079d014190e0b71d224a5
https://doi.org/10.1109/eptc.2013.6745749
https://doi.org/10.1109/eptc.2013.6745749
Autor:
Klaus-Jurgen Wolter, Ehrenfried Zschech, S. Mahajan, N. Kuzeyeva, Müller T, Malgorzata Kopycinska-Müller, Bernd Köhler, Kong Boon Yeap
Publikováno v:
Nanotechnology. 24(35)
We have used the atomic force acoustic microscopy (AFAM) method to determine the indentation modulus of nanoporous thin-film materials with ultralow values of dielectric permittivity (dielectric constant k
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::70ade5b88840268b26489a36893fd402
https://pubmed.ncbi.nlm.nih.gov/23938222
https://pubmed.ncbi.nlm.nih.gov/23938222
Autor:
André Striegler, Bernd Köhler, Malgorzata Kopycinska-Müller, Arnd Hürrich, Klaus Jurgen Wolter, Norbert Meyendorf
Publikováno v:
MRS Proceedings. 1185
Atomic force acoustic microscopy (AFAM) is a non-destructive method able to determine the indentation modulus of a sample with high lateral and depth resolution. We used the AFAM technique to measure the indentation modulus of film-substrate systems
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dcc37108b1e142698ec891c002eb7eb6
https://doi.org/10.1557/proc-1185-ii09-04
https://doi.org/10.1557/proc-1185-ii09-04
Publikováno v:
Microscopy and Microanalysis. 11
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f20a0dcb98b33e63d176f75473fe7c17
https://doi.org/10.1017/s1431927605508419
https://doi.org/10.1017/s1431927605508419