Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Maksim Riabko"'
Autor:
Nikita Dmitriev, Sergey Koptyaev, Andrey Voloshin, Nikita Kondratiev, Valery Lobanov, Kirill Min'kov, Maksim Riabko, Stanislav Polonsky, Igor Bilenko
Dual-comb interferometry is based on self-heterodyning two optical frequency combs, with corresponding mapping of the optical spectrum into the radio-frequency domain. The dual-comb enables diverse applications, including metrology, fast high-precisi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::32959e7497d76a097ff57fbb73dc9732
https://doi.org/10.21203/rs.3.rs-1180955/v1
https://doi.org/10.21203/rs.3.rs-1180955/v1
Autor:
Aleksandr Shorokhov, Maksim Riabko, Boris I. Afinogenov, Anton N. Sofronov, Anton Medvedev, Stanislav Polonsky
Publikováno v:
Physical Review Applied. 15
We report on experimental detection of 10 nm $\mathrm{Si}$ nanoparticles on $\mathrm{Si}$ surface using spatial modulation microscopy. We show that a simple optical layout with a galvo-mirror allows reliable detection of $9\ifmmode\times\else\texttim
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e6d027b27ad6eae74b6580165e915ad
https://doi.org/10.1103/physrevapplied.15.064049
https://doi.org/10.1103/physrevapplied.15.064049
Autor:
Seulgi Lee, I. M. Antropov, Sangwoo Bae, Akinori Ohkubo, Joo Won-Don, Aleksandr Shorokhov, Hosun Yoo, Anton Medvedev, Kyunghun Han, Taehyun Kim, Minhwan Seo, Boris I. Afinogenov, Jeang Eun-Hee, Vladimir O. Bessonov, Maksim Riabko, Lee Sang-Min, Anton N. Sofronov, Ingi Kim
Publikováno v:
Nonlinear Optics and its Applications 2020.
Detection of a single nanoparticle on a bare silicon wafer has been a challenge in the semiconductor industry for decades. Currently, the most successful and widely used technique is dark-field microscopy. However, it is not capable of detecting sing
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0c80a3e9c9e77b99a15747edc787cee0
https://doi.org/10.1117/12.2552708
https://doi.org/10.1117/12.2552708