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pro vyhledávání: '"Makogon, Yu.N."'
Two methods of creation of the TiSi₂(C54) stable phase are reviewed, and their comparison is considered. The formation of the structure of TiSi₂(C54) nanosize films on monocrystalline Si is studied. As shown, the TiSi₂(C54) formation is carried
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::bfe5c8965898e572786d5d48c50a583e
http://dspace.nbuv.gov.ua/handle/123456789/75923
http://dspace.nbuv.gov.ua/handle/123456789/75923
The formation of heterostructures based on nanoscale silicide films in limiting states are exemplified. The nanoscale silicide films of a required phase composition are shown to be obtainable by formation of specific zones, different type interlayers
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::25e4788fa7a74c46e866e122893ce813
http://dspace.nbuv.gov.ua/handle/123456789/138937
http://dspace.nbuv.gov.ua/handle/123456789/138937
Autor:
Sidorenko, S.I., Makogon, Yu.N., Voloshko, S.M., Pavlova, O.P., Kotenko, I.E., Mogilatenko, A.V., Beddies, G.
Publikováno v:
Diffusion and Defect Data Part A: Defect and Diffusion Forum; November 2008, Vol. 280 Issue: 1 p9-14, 6p
Publikováno v:
Diffusion and Defect Data Part A: Defect and Diffusion Forum; April 2007, Vol. 264 Issue: 1 p159-162, 4p
Publikováno v:
Diffusion and Defect Data Part A: Defect and Diffusion Forum; April 2007, Vol. 264 Issue: 1 p155-158, 4p
Autor:
Kudryavtsev, Y.V., Sidorenko, S.I., Makogon, Yu.N., Pavlova, E.P., Verbitskaya, T.I., Lee, Y.P., Hyun, Y.H., Oksenenko, V.A.
Publikováno v:
Diffusion and Defect Data Part A: Defect and Diffusion Forum; April 2005, Vol. 237 Issue: 1 p572-577, 6p
Autor:
Sidorenko, S.I., Tu, K.N., Makogon, Yu.N., Csik, A., Pavlova, E.P., Verbitskaya, T.I., Nesterenko, Yu.V.
Publikováno v:
Diffusion and Defect Data Part A: Defect and Diffusion Forum; February 2003, Vol. 216 Issue: 1 p263-268, 6p
Publikováno v:
Diffusion and Defect Data Part A: Defect and Diffusion Forum; April 2001, Vol. 194 Issue: 1 p1643-1648, 6p
Publikováno v:
Diffusion and Defect Data Part A: Defect and Diffusion Forum; April 2001, Vol. 194 Issue: 1 p1637-1642, 6p
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