Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Majid Namaki-Shoushtari"'
Publikováno v:
2013 International Conference on Hardware/Software Codesign and System Synthesis (CODES+ISSS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16b56c17b451be4fcb868d087fa1670b
https://doi.org/10.1109/codes-isss.2013.6659017
https://doi.org/10.1109/codes-isss.2013.6659017
Publikováno v:
ITC
Loss of signal integrity in today's deep sub-micron designs puts communication links at a higher risk of permanent or more frequent intermittent faults. This results in performance and reliability reduction. This paper presents an online interconnect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::438d217afccfa7bc76d6870f0ce50644
https://doi.org/10.1109/test.2012.6401583
https://doi.org/10.1109/test.2012.6401583
Publikováno v:
Asian Test Symposium
Inserting scan chain into the circuit alongside the combinational automatic test pattern generation (ATPG) is the most commonly used test technique for digital circuits. Since power dissipation in test mode is generally much higher than in the functi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f0be68e5677ff9c2539a69377b06d71
https://doi.org/10.1109/ats.2012.38
https://doi.org/10.1109/ats.2012.38
Publikováno v:
Asian Test Symposium
Advances in semiconductor technology, the increasing complexity of digital systems and demand for faster time to market, have raised the level of design from transistor to Electronic System Level (ESL). However, digital system testing remains at lowe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::19b1d44e078e2168692b2c83be3c5b6f
https://doi.org/10.1109/ats.2011.94
https://doi.org/10.1109/ats.2011.94
Publikováno v:
ICME
In order to accommodate the wide range of applications and the corresponding platforms where the H.264/AVC standard is currently in place, one should be able to optimize the encoder's computational complexity with a careful selection of the coding co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c6f6d3bddf5f4140663be925a0283a68
https://doi.org/10.1109/icme.2011.6012145
https://doi.org/10.1109/icme.2011.6012145
Publikováno v:
EWDTS
This paper discusses a set of functions which are added to Verilog through its PLI interface that facilitates test and application of test programs to designs at the RT level. Using this package, not only enables a designer to apply test programs to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f62c00ebbaf35a2d0ef3076ac29bbdf
https://doi.org/10.1109/ewdts.2010.5742076
https://doi.org/10.1109/ewdts.2010.5742076