Zobrazeno 1 - 10
of 33
pro vyhledávání: '"Maik Kahnt"'
Autor:
Srutarshi Banerjee, Doğa Gürsoy, Junjing Deng, Maik Kahnt, Matthew Kramer, Matthew Lynn, Daniel Haskel, Jörg Strempfer
Publikováno v:
Journal of Synchrotron Radiation, Vol 31, Iss 4, Pp 877-887 (2024)
Nanoscale structural and electronic heterogeneities are prevalent in condensed matter physics. Investigating these heterogeneities in 3D has become an important task for understanding material properties. To provide a tool to unravel the connection b
Externí odkaz:
https://doaj.org/article/1f04218bd7054f71bd9c76de2ad47927
Autor:
Tang Li, Maik Kahnt, Thomas L. Sheppard, Runqing Yang, Ken V. Falch, Roman Zvagelsky, Pablo Villanueva‐Perez, Martin Wegener, Mikhail Lyubomirskiy
Publikováno v:
Advanced Science, Vol 11, Iss 30, Pp n/a-n/a (2024)
Abstract Hard X‐rays are needed for non‐destructive nano‐imaging of solid matter. Synchrotron radiation facilities (SRF) provide the highest‐quality images with single‐digit nm resolution using advanced techniques such as X‐ray ptychograp
Externí odkaz:
https://doaj.org/article/35929a5ba27b437389a7fec3dc720a7b
Autor:
Dina Carbone, Sebastian Kalbfleisch, Ulf Johansson, Alexander Björling, Maik Kahnt, Simone Sala, Tomas Stankevic, Angel Rodriguez-Fernandez, Björn Bring, Zdenek Matej, Paul Bell, David Erb, Vincent Hardion, Clemens Weninger, Hussein Al-Sallami, Julio Lidon-Simon, Stefan Carlson, Annika Jerrebo, Brian Norsk Jensen, Anders Bjermo, Karl Åhnberg, Linus Roslund
Publikováno v:
Journal of Synchrotron Radiation, Vol 29, Iss 3, Pp 876-887 (2022)
The diffraction endstation of the NanoMAX beamline is designed to provide high-flux coherent X-ray nano-beams for experiments requiring many degrees of freedom for sample and detector. The endstation is equipped with high-efficiency Kirkpatrick–Bae
Externí odkaz:
https://doaj.org/article/758a11057e6e4b028252cc358e35fcec
Autor:
Simone Sala, Yuhe Zhang, Nathaly De La Rosa, Till Dreier, Maik Kahnt, Max Langer, Lars B. Dahlin, Martin Bech, Pablo Villanueva-Perez, Sebastian Kalbfleisch
Publikováno v:
Journal of Synchrotron Radiation, Vol 29, Iss 3, Pp 807-815 (2022)
X-ray fluorescence microscopy performed at nanofocusing synchrotron beamlines produces quantitative elemental distribution maps at unprecedented resolution (down to a few tens of nanometres), at the expense of relatively long measuring times and high
Externí odkaz:
https://doaj.org/article/9f8cc175c334437eb79fe09a1e8787f7
Autor:
Mikhail Lyubomirskiy, Felix Wittwer, Maik Kahnt, Frieder Koch, Adam Kubec, Ken Vidar Falch, Jan Garrevoet, Martin Seyrich, Christian David, Christian G. Schroer
Publikováno v:
Scientific Reports, Vol 12, Iss 1, Pp 1-9 (2022)
Abstract Imaging large areas of a sample non-destructively and with high resolution is of great interest for both science and industry. For scanning coherent X-ray diffraction microscopy, i. e., ptychography, the achievable scan area at a given spati
Externí odkaz:
https://doaj.org/article/5a1d22a6bd224738a8b573b3fe0dda55
Autor:
Sebastian Kalbfleisch, Yuhe Zhang, Maik Kahnt, Khachiwan Buakor, Max Langer, Till Dreier, Hanna Dierks, Philip Stjärneblad, Emanuel Larsson, Korneliya Gordeyeva, Lert Chayanun, Daniel Söderberg, Jesper Wallentin, Martin Bech, Pablo Villanueva-Perez
Publikováno v:
Journal of Synchrotron Radiation, Vol 29, Iss 1, Pp 224-229 (2022)
Coherent X-ray imaging techniques, such as in-line holography, exploit the high brilliance provided by diffraction-limited storage rings to perform imaging sensitive to the electron density through contrast due to the phase shift, rather than convent
Externí odkaz:
https://doaj.org/article/b54c14adef7548318f43594f65d2e755
Autor:
Maik Kahnt, Lukas Grote, Dennis Brückner, Martin Seyrich, Felix Wittwer, Dorota Koziej, Christian G. Schroer
Publikováno v:
Scientific Reports, Vol 11, Iss 1, Pp 1-11 (2021)
Abstract Ptychographic X-ray microscopy is an ideal tool to observe chemical processes under in situ conditions. Chemical reactors, however, are often thicker than the depth of field, limiting the lateral spatial resolution in projection images. To o
Externí odkaz:
https://doaj.org/article/a6ab2120ac4245d3910c1709d80d9187
Autor:
Silvio Achilles, Simeon Ehrig, Nico Hoffmann, Maik Kahnt, Johannes Becher, Yakub Fam, Thomas Sheppard, Dennis Brückner, Andreas Schropp, Christian G. Schroer
Publikováno v:
SPIE Optical Engineering + Applications, 14.10.2022, San Diego, USAProc. SPIE 12242, Developments in X-Ray Tomography XIV, 122420N
Scanning coherent X-ray microscopy (ptychography) has gained considerable interest during the last decade since the performance of this indirect imaging technique does not necessarily rely on the quality of the X-ray optics and, in principle, can ach
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d83c2055e2f36ed49490b5bf1933a95f
https://www.hzdr.de/publications/Publ-36632-1
https://www.hzdr.de/publications/Publ-36632-1
Autor:
Alexander Björling, Ann E. Terry, Maik Kahnt, Konstantin Klementiev, Tomás S. Plivelic, Clemens Weninger, Vahid Haghighat
Publikováno v:
Journal of Synchrotron Radiation
The coherence properties of the beam provided at the CoSAXS beamline at the MAX IV Laboratory are determined experimentally using multi-mode ptychography. The coherent fraction of the beam is then used for a proof-of-concept XPCS measurement, illustr
Autor:
Maik, Kahnt, Sebastian, Kalbfleisch, Alexander, Björling, Erik, Malm, Louisa, Pickworth, Ulf, Johansson
Publikováno v:
Optics express. 30(23)
We demonstrate how the individual mirrors of a high-quality Kirkpatrick-Baez (KB) mirror system can be aligned to each other to create an optimally focused beam, through minimizing aberrations in the phase of the ptychographically reconstructed pupil