Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Mahmoud Alashi"'
Publikováno v:
IET Power Electronics, Vol 17, Iss 3, Pp 364-374 (2024)
Abstract The series‐type direct current (DC) hybrid circuit breaker (S‐HCB) concept was previously reported to offer better performance than solid‐state circuit breakers (SSCB) and hybrid circuit breakers (HCB). S‐HCB offers low conduction po
Externí odkaz:
https://doaj.org/article/92b5ef584bb84082bb6536db6c79e7b4
Publikováno v:
2021 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting (APS/URSI).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b79192a487057ef3598f62017b395c62
https://doi.org/10.1109/aps/ursi47566.2021.9704600
https://doi.org/10.1109/aps/ursi47566.2021.9704600
Publikováno v:
Electronics
Volume 9
Issue 3
Electronics, Vol 9, Iss 3, p 469 (2020)
Volume 9
Issue 3
Electronics, Vol 9, Iss 3, p 469 (2020)
It is broadly accepted that the silicon-based CMOS has touched its scaling limits and alternative substrate materials are needed for future technology nodes. An Indium-Gallium-Arsenide ( I n G a A s )-based device is well situated for further technol
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4b6b70306fa2694bb0fc1b3412f70e81
Publikováno v:
Electronics, Vol 9, Iss 3, p 490 (2020)
Electronics
Volume 9
Issue 3
Electronics
Volume 9
Issue 3
Voltage-to-time and current-to-time converters have been used in many recent works as a voltage-to-digital converter for artificial intelligence applications. In general, most of the previous designs use the current-starved technique or a capacitor-b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::08769354085a307feaeeabec52c9084a
https://www.mdpi.com/2079-9292/9/3/490
https://www.mdpi.com/2079-9292/9/3/490
Publikováno v:
Electronics
Volume 9
Issue 3
Electronics, Vol 9, Iss 3, p 384 (2020)
Volume 9
Issue 3
Electronics, Vol 9, Iss 3, p 384 (2020)
Automation of vehicles requires a secure, reliable, and real-time on-chip system. These systems also require very high-speed and compact on-chip analog to digital converters (ADC). The conventional ADC cannot fulfill this requirement. In this paper,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::325ae7c2c8dc1f6788b67d000954f010
https://doi.org/10.3390/electronics9030384
https://doi.org/10.3390/electronics9030384
Publikováno v:
Electronics
Volume 9
Issue 2
Electronics, Vol 9, Iss 2, p 326 (2020)
Volume 9
Issue 2
Electronics, Vol 9, Iss 2, p 326 (2020)
Process Variation (PV), Bias Temperature Instability (BTI) and Time-Dependent Dielectric Breakdown (TDDB) are the critical factors that affect the reliability of semiconductor chip design. They cause the system to be unstable and increase the soft er
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::28e93a8267f5d10d4dfc3d38d4f29f8c
https://doi.org/10.3390/electronics9020326
https://doi.org/10.3390/electronics9020326