Zobrazeno 1 - 10
of 100
pro vyhledávání: '"Maher, D. M."'
Autor:
Augustine, B. H., Irene, E. A., He, Y. J., Price, K. J., McNeil, L. E., Christensen, K. N., Maher, D. M.
Publikováno v:
Journal of Applied Physics; 9/15/1995, Vol. 78 Issue 6, p4020, 11p, 1 Chart, 7 Graphs
Publikováno v:
Journal of Applied Physics; 6/1/1988, Vol. 63 Issue 11, p5295, 7p, 8 Black and White Photographs, 3 Diagrams
Publikováno v:
Journal of Applied Physics; 10/15/1987, Vol. 62 Issue 8, p3156, 5p, 3 Black and White Photographs, 1 Diagram, 1 Chart, 4 Graphs
Publikováno v:
Journal of Applied Physics; Aug1979, Vol. 50 Issue 8, p5105-5109, 5p
Publikováno v:
Journal of Applied Physics; Dec1977, Vol. 48 Issue 12, p5038-5042, 5p
Publikováno v:
Journal of Applied Physics; Sep1976, Vol. 47 Issue 9, p3813-3825, 13p
Autor:
Hsieh, C. M., Maher, D. M.
Publikováno v:
Journal of Applied Physics; Mar1973, Vol. 44 Issue 3, p1302-1306, 5p
Autor:
McNeil, L. E., Christensen, K. N., He, Y. J., Augustine, B. H., Price, K. J., Irene, E. A., Maher, D. M.
We report the fabrication, chemical, optical, and photoluminescence characterization of amorphous silicon‐rich oxynitride (SiO x N y :H) thin films by plasma‐enhanced chemical‐vapor deposition. The film compositions were followed by changes in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cc3428af21f6073b705619a7bb811d13
Publikováno v:
Scanning Microscopy
Etching, lithography, hole formation, surface restructuring and external machining can all be performed on a nanometre scale using an intense electron beam. Results are presented for a range of different materials which demonstrate the variety of mec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1459::a3ff4a10100615a4f571c87672b84c9f
https://digitalcommons.usu.edu/context/microscopy/article/1535/viewcontent/WDCcenterscan1990HumphreysBulloughDevenish_ElectronBeamNano_Etching.pdf
https://digitalcommons.usu.edu/context/microscopy/article/1535/viewcontent/WDCcenterscan1990HumphreysBulloughDevenish_ElectronBeamNano_Etching.pdf
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.