Zobrazeno 1 - 10
of 113
pro vyhledávání: '"Mahendra P. Kothiyal"'
Interferometry has been widely used for optical metrology and imaging applications because of their precision, reliability, and versatility. Although single-wavelength interferometery can provide high sensitivity and resolution, it has several drawba
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::565eb0be6fbdd78bac4a08a67ea7784d
https://hdl.handle.net/10356/80246
https://hdl.handle.net/10356/80246
Publikováno v:
Optics and Lasers in Engineering. 50:1084-1088
In laser based interferometry, the unambiguous measurement range is limited to half a wavelength. Multiple wavelength or white light interferometer is used to overcome this difficulty. In this paper a white light interferometer with a colour CCD came
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::20d7072c5893dfb15024a452e39c4811
https://doi.org/10.1016/j.optlaseng.2012.02.002
https://doi.org/10.1016/j.optlaseng.2012.02.002
Publikováno v:
Journal of Optics. 40:176-183
Surface discontinuities greater than half a wavelength can not be measured unambiguously using single wavelength interferometry. In TV holography, it is difficult to quantify the data under relatively large loading conditions due to the overcrowding
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f3bf66f497830edf60da38436dc2681d
https://doi.org/10.1007/s12596-011-0051-z
https://doi.org/10.1007/s12596-011-0051-z
Publikováno v:
Optik. 122:49-54
This paper describes a microscopic TV holographic arrangement to study the static and vibrating microsystems. In the optical setup, the object beam and the reference beam arms are provided with a phase shifting mirror and a bias phase modulation mirr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::41d6069fc0be7166ea0c763b4dddfac4
https://doi.org/10.1016/j.ijleo.2010.02.002
https://doi.org/10.1016/j.ijleo.2010.02.002
Publikováno v:
Optics and Lasers in Engineering. 47:1125-1130
Spectral phase in a white-light interferogram contains information about the absolute optical path difference (OPD) in the interferometer. Evaluation of spectral phase is therefore important in applications such as profilometry with white light. In s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::85a7f35e2e58f5980bc5e2b1608f346e
https://doi.org/10.1016/j.optlaseng.2009.06.014
https://doi.org/10.1016/j.optlaseng.2009.06.014
Publikováno v:
Optik. 119:147-152
Digital speckle pattern interferometry (DSPI) is a tool for making qualitative as well as quantitative measurements of deformation of objects. Phase-shifting algorithms in DSPI are useful for extracting quantitative deformation data from the system.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::00ec6d7bc382c8b44c4ab39b28c663cc
https://doi.org/10.1016/j.ijleo.2006.07.014
https://doi.org/10.1016/j.ijleo.2006.07.014
Publikováno v:
Optics Communications. 272:9-14
This paper presents a real-time digital speckle pattern interferometry system with twofold increase in sensitivity for the measurement of in-plane displacement and first order derivative of out-of-plane displacement (slope). Spatial phase shifting te
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a63d1061033914ede448500d9fc98980
https://doi.org/10.1016/j.optcom.2006.11.012
https://doi.org/10.1016/j.optcom.2006.11.012
White light single-shot interferometry with colour CCD camera for optical inspection of microsystems
Publikováno v:
SPIE Proceedings.
White light interferometry is a well-established optical tool for surface metrology of reflective samples. In this work, we discuss a single-shot white light interferometer based on single-chip color CCD camera and Hilbert transformation. The approac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3646c67ea9a371fe39bef39fae80868d
https://doi.org/10.1117/12.2185802
https://doi.org/10.1117/12.2185802
Publikováno v:
SPIE Proceedings.
Single wavelength microscopic speckle interferometry is widely used for deformation, shape and non-destructive testing (NDT) of engineering structures. However the single wavelength configuration fails to quantify the large deformation due to the ove
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::66bf9f161920146332d789e0ca7b83d1
https://doi.org/10.1117/12.2081122
https://doi.org/10.1117/12.2081122