Zobrazeno 1 - 10
of 119
pro vyhledávání: '"Mahendra P. Kothiyal"'
Autor:
Allan J. Lightman
Publikováno v:
Optical Engineering. 31:174
Interferometry has been widely used for optical metrology and imaging applications because of their precision, reliability, and versatility. Although single-wavelength interferometery can provide high sensitivity and resolution, it has several drawba
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::565eb0be6fbdd78bac4a08a67ea7784d
https://hdl.handle.net/10356/80246
https://hdl.handle.net/10356/80246
Publikováno v:
Optics and Lasers in Engineering. 50:1084-1088
In laser based interferometry, the unambiguous measurement range is limited to half a wavelength. Multiple wavelength or white light interferometer is used to overcome this difficulty. In this paper a white light interferometer with a colour CCD came
Publikováno v:
Journal of Optics. 40:176-183
Surface discontinuities greater than half a wavelength can not be measured unambiguously using single wavelength interferometry. In TV holography, it is difficult to quantify the data under relatively large loading conditions due to the overcrowding
Publikováno v:
Optik. 122:49-54
This paper describes a microscopic TV holographic arrangement to study the static and vibrating microsystems. In the optical setup, the object beam and the reference beam arms are provided with a phase shifting mirror and a bias phase modulation mirr
Publikováno v:
Optics and Lasers in Engineering. 47:1125-1130
Spectral phase in a white-light interferogram contains information about the absolute optical path difference (OPD) in the interferometer. Evaluation of spectral phase is therefore important in applications such as profilometry with white light. In s
Publikováno v:
Optik. 119:147-152
Digital speckle pattern interferometry (DSPI) is a tool for making qualitative as well as quantitative measurements of deformation of objects. Phase-shifting algorithms in DSPI are useful for extracting quantitative deformation data from the system.
Publikováno v:
Optics Communications. 272:9-14
This paper presents a real-time digital speckle pattern interferometry system with twofold increase in sensitivity for the measurement of in-plane displacement and first order derivative of out-of-plane displacement (slope). Spatial phase shifting te
White light single-shot interferometry with colour CCD camera for optical inspection of microsystems
Publikováno v:
SPIE Proceedings.
White light interferometry is a well-established optical tool for surface metrology of reflective samples. In this work, we discuss a single-shot white light interferometer based on single-chip color CCD camera and Hilbert transformation. The approac