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pro vyhledávání: '"Magdeliza Magdeliza"'
Autor:
Indahwan Jony, Ang Ghim Boon, David Zhu, Alfred Quah, Magdeliza Magdeliza, Chen Changqing, Neo Soh Ping, Lee Mern Tat
Publikováno v:
International Symposium for Testing and Failure Analysis.
In this paper, a low yield case relating to a systematic array of failures in a ring pattern due to ADC_PLL failures on low yielding wafers will be studied. A systematic problem solving process based on the application of a variety of FA techniques s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3aa3169dd923496acdfacf08a8e31876
https://doi.org/10.31399/asm.cp.istfa2010p0058
https://doi.org/10.31399/asm.cp.istfa2010p0058
