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pro vyhledávání: '"Magdeliza G"'
Autor:
Neo Soh Ping, Lee Mern Tat, Chen Changqing, Ang Ghim Boon, Ng Hui Peng, Indahwan Jony, Magdeliza G
Publikováno v:
International Symposium for Testing and Failure Analysis.
In this paper, a zero yield case relating to a systematic defect in N+ poly/N-well varactor (voltage controlled capacitor) on the RF analog circuitry will be studied. The systematic problem solving process based on the application of a variety of FA
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8f47e9584ed97928a20fa0e681d1a821
https://doi.org/10.31399/asm.cp.istfa2012p0370
https://doi.org/10.31399/asm.cp.istfa2012p0370
Publikováno v:
ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575); 2002, p22-26, 5p
Conference
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The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
This title features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect