Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Magdalena Sienkiewicz"'
Autor:
Pawel Abramowicz, Jerzy Konstantynowicz, Bogdan Cylwik, Magdalena Sienkiewicz, Monika Gudowska-Sawczuk, Lech Chrostek, Ewa Gruszewska
Publikováno v:
Rheumatology International
It is reported that alterations in protein glycosylation are present in adult rheumatic diseases; however, the data related to pediatric rheumatic conditions are very scarce. The aim of this study was to assess the effect of juvenile idiopathic arthr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5adefb9923e0cf4e13ca70de23fc4163
https://doi.org/10.1007/s00296-018-4051-z
https://doi.org/10.1007/s00296-018-4051-z
Autor:
Philippe Perdu, Abdellatif Firiti, Olivier Crepel, Magdalena Sienkiewicz, Kevin Sanchez, Dean Lewis
Publikováno v:
Microelectronics Reliability. 48:1529-1532
The mixed-mode ICs (Integrated Circuits), by involving multiple functions (digital, analog, RF, power) inside one device, are becoming more compact and useful. At the same time, their developments and Failure Analysis (FA) are more and more complex:
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cd8504515578e0d40bce28b1666bede5
https://doi.org/10.1016/j.microrel.2008.07.060
https://doi.org/10.1016/j.microrel.2008.07.060
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper presents a case study on reliability reject on a Freescale mixed-mode IC. It focuses on a novel use of one of most frequently used failure localization techniques: static emission microscopy (EMMI) to localize a failure due to an electrica
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::67403945ceb88b1f5f325bb123b9b021
https://doi.org/10.31399/asm.cp.istfa2013p0452
https://doi.org/10.31399/asm.cp.istfa2013p0452
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper presents a case study on scan test reject in a mixed mode IC. It focuses on the smart use of combined mature FA techniques, such as Soft Defect Localization (SDL) and emission microscopy (EMMI), to localize a random scan test anomaly at th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::12bb116f01f2c1e33d93fe355aed54a7
https://doi.org/10.31399/asm.cp.istfa2012p0228
https://doi.org/10.31399/asm.cp.istfa2012p0228
Autor:
Kevin Sanchez, Magdalena Sienkiewicz, Olivier Crepel, Dean Lewis, Abdellatif Firiti, Luigi Cattaneo, Philippe Perdu
Publikováno v:
International Symposium for Testing and Failure Analysis.
The failure localization on analog & mixed mode ICs in functional mode (AC signals) has become more and more challenging in the last few years. Due to an increasing integration and complexity of these devices, the number of defects, especially those
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c46f511801ede25c24aae1d352dc9229
https://doi.org/10.31399/asm.cp.istfa2009p0278
https://doi.org/10.31399/asm.cp.istfa2009p0278
Publikováno v:
International Symposium for Testing and Failure Analysis.
Soft defects localization by laser techniques on dynamically working ICs is widely used for Failure Analysis (FA). In this context, many AC signal-oriented analysis methods have been introduced to date (SDL, LADA…) or are under development (xVM…)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::70874f0f98f9912153e3948f88791fcc
https://doi.org/10.31399/asm.cp.istfa2008p0233
https://doi.org/10.31399/asm.cp.istfa2008p0233
Publikováno v:
2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Technology advances in mixed-mode and analog ICs, involving multiple functions inside the device, make Failure Analysis (FA) difficult. Variation Mapping techniques based on Thermal Laser Stimulation (TLS [1],[2],[3]) have already proven their effici
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9879fb188f900f06310447cf69f3ca37
https://doi.org/10.1109/ipfa.2008.4588148
https://doi.org/10.1109/ipfa.2008.4588148
Autor:
Kevin Sanchez, Olivier Crepel, Magdalena Sienkiewicz, Dean Lewis, Abdellatif Firiti, Philippe Perdu
Publikováno v:
International Symposium for Testing and Failure Analysis.
Soft defect localization techniques based on laser stimulation have become key techniques for a wide range of FA/debug issues. In this paper, we demonstrate the ability of these techniques to solve critical design issue in mixed-mode device for autom
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::05b2ba35d74e4d49dbaccb3691b417f6
https://doi.org/10.31399/asm.cp.istfa2007p0086
https://doi.org/10.31399/asm.cp.istfa2007p0086