Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Madhav Mehra"'
Autor:
James P. Lavine, J.C. Cassidy, David L. Losee, B.C. Burkey, Gilbert Alan Hawkins, A.K. Weiss, E.A. Trabka, W.C. McColgin, G. Geisbuesch, R.P. Khosla, Edward T. Nelson, Madhav Mehra
Publikováno v:
IEEE International Solid-State Circuits Conference.
The authors report results obtained on a full-color interline transfer CCD (charged-coupled device) image sensor with pixel dimensions of 8.6 mu m(H)*6.8 mu m(V) using 1.2- mu m design rules and a two-phase, single-polysilicon-per-phase technology. I
Autor:
Stephen L. Kosman, Teh-Hsuang Lee, B.C. Burkey, Wesley A. Miller, Madhav Mehra, Win-Chyi Chang, Gilbert Alan Hawkins, R.P. Khosla, Paul L. Roselle, J.C. Cassidy, Eric G. Stevens
Publikováno v:
International Technical Digest on Electron Devices.
A large-area, 1.3 million pixel, full-frame CCD (charge coupled device) image sensor has been developed that incorporates both a lateral-overflow drain (LOD) for antiblooming control and a transparent indium-tin oxide (ITO) gate electrode for increas
Autor:
Biay-Cheng Hseih, Paul L. Roselle, K. Jayakar, Win-Chyi Chang, Madhav Mehra, Y.C. Lo, Stephen L. Kosman
Publikováno v:
MRS Proceedings. 262
The electrical and optical properties of Indium-Tin-Oxide (ITO) films, deposited by radio frequency (r.f.) magnetron sputtering, were studied. ITO films, when deposited using optimum sputtering conditions, were reproducibly prepared with resistivity
Publikováno v:
Solid State Communications. 47:859-862
We report X-ray diffraction studies and density measurements on liquid quenched foils and sputter deposited films of the amorphous metallic alloy, (Mo0.6Ru0.4)82B18. The crystallization temperature (Tx) for both the films and the foils is ∼800 ± 1
Publikováno v:
Physical Review B. 28:624-628
In this paper we present detailed x-ray-diffraction studies on the metallic glass system ${({\mathrm{Ru}}_{0.84}{\mathrm{Zr}}_{0.16})}_{1\ensuremath{-}x}{\mathrm{B}}_{x}$ over the composition range $0.46\ensuremath{\le}x\ensuremath{\le}0.52$. Availab
Publikováno v:
Journal of Non-Crystalline Solids. :859-864
X-ray diffraction and relaxation studies indicate that boron atoms play an important role in the structure and stability of (Mo 0.6 Ru 0.4 ) 100-x B x glasses. Glasses with higher B contents are found to be more stable with respect to crystallization
Publikováno v:
Journal of Physics F: Metal Physics. 15:2109-2120
Crystallisation of (Mo_(0.6)Ru_(0.4))100_(-x)B_x glasses takes place in three steps: the first step corresponds to the precipitation of the sigma phase Mo_5Ru_3 which decomposes at higher temperatures, the second step is associated with the formation
Publikováno v:
Journal of Physics F: Metal Physics. 12:1861-1868
Rhodium-based metallic glasses have been produced with over 40 at.% metalloids (Si and B). X-ray diffraction studies are presented here on Rh0.92-xBxSi0.08 metallic glasses, with x=0.22, 0.27 and 0.32, as well as mechanical, electrical and thermal an
Publikováno v:
Journal of Applied Physics. 58:3409-3414
Refractory metallic coatings of (W/0.6/ Re/0.4/)76B24 (WReB) have been deposited onto glass, quartz, and heat-treated AISI 52100 bearing steel substrates by dc magnetron sputtering. As-deposited WReB films are amorphous, as shown by their diffuse X-r
Autor:
Madhav Mehra, Howard Edgar Rhodes
Publikováno v:
MRS Proceedings. 70
The results obtained upon reactively RF sputtering indium - tin oxide (ITO) films are presented. It is found that while the amount of oxygen in the chamber is very critical in determining the properties of the films, it is easy to deposit reproducibl