Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Madeline Esposito"'
Autor:
A. Privat, Lawrence T. Clark, John Brunhaver, Madeline Esposito, A. Duvnjak, Hugh J. Barnaby, Matthew J. Marinella, Jack E. Manuel, Keith E. Holbert, R. Jokai, M. Spear, Michael Lee McLain, M. P. King
Publikováno v:
IEEE Transactions on Nuclear Science. 68:671-676
Total ionizing dose response of 14-nm bulk-Si FinFETs has been studied with a specially designed test chip. The radiation testing shows evidence of interface trap build-up on 14-nm Bulk FinFET technologies. These defects created in the isolation laye
Autor:
A. Privat, John Brunhaver, Edward S. Bielejec, Madeline Esposito, Jeramy R. Dickerson, David S. Ashby, Diana Garland, A. Alec Talin, Jack E. Manuel, M. P. King, Gyorgy Vizkelethy, T. Patrick Xiao, Matthew J. Marinella, Michael Lee McLain, Hugh J. Barnaby
Publikováno v:
IEEE Transactions on Nuclear Science. 68:724-732
Bulk 14-nm FinFET technology was irradiated in a heavy-ion environment (42-MeV Si ions) to study the possibility of displacement damage (DD) in scaled technology devices, resulting in drive current degradation with increased cumulative fluence. These
Autor:
Albert Talin, David Ashby, Diana Garland, Madeline Esposito, Zoey Warecki, Gyorgy Vizkelethy, Juan Llinas, Andrew Armstrong, John Cumings, Matthew Marinella
Publikováno v:
Proposed for presentation at the Microelectronics Reliability and Qualification Workshop held February 9-11, 2021 in Los Angeles (online), CA..
Autor:
A. Privat, Jack E. Manuel, Michael Lee McLain, John Brunhaver, Matthew J. Marinella, M. Spear, R. Jokai, Keith E. Holbert, Lawrence T. Clark, A. Duvnjak, Michael King, Hugh J. Barnaby, Madeline Esposito
Publikováno v:
Proposed for presentation at the Nuclear & Space Radiation Effects Conference (NSREC) 2020 held December 1-8, 2020..
Publikováno v:
Wide Bandgap Semiconductor-Based Electronics ISBN: 9780750325165
Wide Bandgap Semiconductor-Based Electronics
Wide Bandgap Semiconductor-Based Electronics
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9c30374bda4060e131b4c92e37601930
https://doi.org/10.1088/978-0-7503-2516-5ch14
https://doi.org/10.1088/978-0-7503-2516-5ch14
Autor:
Christopher H. Bennett, Andrew M. Tonigan, David Russell Hughart, Matthew Marinella, Robert A. Weller, Robert A. Reed, Ronald D. Schrimpf, Joseph G. Salas, Madeline Esposito, Dolores A. Black, Michael Lee McLain, Dennis R. Ball, Jeffrey D. Black, M. L. Breeding
Publikováno v:
Proposed for presentation at the Radiation and its Effects on Components and Systems (RADECS) 2020 held October 19 - November 20, 2020 in Virtual, Virtual, Virtual..
Autor:
A. Alec Talin, Matthew J. Marinella, Gyorgy Vizkelethy, David S. Ashby, Madeline Esposito, Diana Garland, Juan Pablo Llinas, Michael Lee McLain
Publikováno v:
Applied Physics Letters. 118:202104
The rapidly increasing use of electronics in high-radiation environments and the continued evolution in transistor architectures and materials demand improved methods to characterize the potential damaging effects of radiation on device performance.