Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Mabel Ruiz Lopez"'
Autor:
Konstantin Kharitonov, Masoud Mehrjoo, Mabel Ruiz-Lopez, Barbara Keitel, Svea Kreis, Seung-gi Gang, Rui Pan, Alessandro Marras, Jonathan Correa, Cornelia B. Wunderer, Elke Plönjes
Publikováno v:
Scientific Reports, Vol 12, Iss 1, Pp 1-9 (2022)
Abstract In this work, single-shot ptychography was adapted to the XUV range and, as a proof of concept, performed at the free-electron laser FLASH at DESY to obtain a high-resolution reconstruction of a test sample. Ptychography is a coherent diffra
Externí odkaz:
https://doaj.org/article/9fff5033530d4824bd462ed4d35d1549
Autor:
Mehdi Ravandeh, Masoud Mehrjoo, Konstantin Kharitonov, Jan Schäfer, Antje Quade, Bruno Honnorat, Mabel Ruiz-Lopez, Barbara Keitel, Svea Kreis, Rui Pan, Seung-gi Gang, Kristian Wende, Elke Plönjes
Publikováno v:
Polymers, Vol 14, Iss 13, p 2528 (2022)
Polyethylene terephthalate (PET) is a thermoplastic polyester with numerous applications in industry. However, it requires surface modification on an industrial scale for printing and coating processes and plasma treatment is one of the most commonly
Externí odkaz:
https://doaj.org/article/bb498ea742b54f83a99d05b0faf39608
Autor:
Jaromir Chalupsky, Vojtech Vozda, Jan Hering, Jan Kybic, Tomas Burian, Siarhei Dziarzhytski, Katerina Frantalova, Vera Hajkova, Simon Jelinek, Libor Juha, Barbara Keitel, Zuzana Kuglerová, Marion Kuhlmann, Bohdan Petryshak, Mabel Ruiz Lopez, Ludek Vysin, Thomas Wodzinski, Elke Plönjes
Publikováno v:
Optics Express.
Autor:
Mabel Ruiz-Lopez, Masoud Mehrjoo, Barbara Keitel, Elke Plönjes, Domenico Alj, Guillaume Dovillaire, Lu Li, Philippe Zeitoun
Publikováno v:
Sensors, Vol 20, Iss 22, p 6426 (2020)
Wavefront analysis is a fast and reliable technique for the alignment and characterization of optics in the visible, but also in the extreme ultraviolet (EUV) and X-ray regions. However, the technique poses a number of challenges when used for optica
Externí odkaz:
https://doaj.org/article/efb840cc52c84e29b0de919cdf83871b
Publikováno v:
Photonics, Vol 2, Iss 1, Pp 241-255 (2015)
Several applications in material science and magnetic holography using extreme ultraviolet (EUV) radiation require the measurement of the degree and state of polarization. In this work, an instrument to measure simultaneously both parameters from EUV
Externí odkaz:
https://doaj.org/article/57da31f9407a4711888505a2e60bd663
Autor:
Konstantin, Kharitonov, Masoud, Mehrjoo, Mabel, Ruiz-Lopez, Barbara, Keitel, Svea, Kreis, Martin, Seyrich, Mihai, Pop, Elke, Plönjes
Publikováno v:
Optics express. 29(14)
Ptychography, a scanning coherent diffraction imaging method, can produce a high-resolution reconstruction of a sample and, at the same time, of the illuminating beam. The emergence of vacuum ultraviolet and X-ray free electron lasers (FELs) has brou
Autor:
Davide Bleiner, Mabel Ruiz-Lopez
Publikováno v:
International Conference on X-Ray Lasers 2020.
Lensless imaging requires coherent illumination, which is typically available at beamlines. A study of lensless imaging with a table-top X-ray laser is presented, comparing two alternative data-processing techniques, i.e. using the near and the far f
Autor:
Barbara Keitel, Thomas Wodzinski, Marta Fajardo, Masoud Mehrjoo, Mabel Ruiz-Lopez, S. Künzel, M. Brachmanski, Elke Plönjes, Marion Kuhlmann
Publikováno v:
Journal of physics communications 4, 075014 (2020). doi:10.1088/2399-6528/aba3b0
Journal of Physics Communications
Journal of Physics Communications
Journal of physics communications 4, 075014 (2020). doi:10.1088/2399-6528/aba3b0
We measured the transverse coherence at FLASH2, a variable gap undulator line at the FLASH free-electron laser user facility at DESY in Hamburg. We demonstrate, the
We measured the transverse coherence at FLASH2, a variable gap undulator line at the FLASH free-electron laser user facility at DESY in Hamburg. We demonstrate, the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6f1eb16a7366ea755e1f68159a85fa1c
https://bib-pubdb1.desy.de/record/441868
https://bib-pubdb1.desy.de/record/441868
Autor:
Lu Li, Marta Fajardo, Ombeline de La Rochefoucauld, Jayanath Koliyadu, Hannah Donnelly, Mabel Ruiz-Lopez, Olivier Delmas, Cangtao Zhou, Matthew Zepf, Domenico Alj, Philippe Zeitoun, Guillaume Dovillaire, Shuangchen Ruan, Brendan Dromey
Publikováno v:
Optics Letters
Optics Letters, 2020, 45 (15), pp.4248. ⟨10.1364/OL.396356⟩
Optics Letters, Optical Society of America-OSA Publishing, 2020, 45 (15), pp.4248. ⟨10.1364/OL.396356⟩
Optics Letters, 2020, 45 (15), pp.4248. ⟨10.1364/OL.396356⟩
Optics Letters, Optical Society of America-OSA Publishing, 2020, 45 (15), pp.4248. ⟨10.1364/OL.396356⟩
We present a novel, to the best of our knowledge, Hartmann wave front sensor for extreme ultraviolet (EUV) spectral range with a numerical aperture (NA) of 0.15. The sensor has been calibrated using an EUV radiation source based on gas high harmonic
Autor:
Tetsuya Kawachi, Yoshinori Tange, Masaharu Nishikino, Kazuo Tanaka, Alexander Mitrofanov, T Habara, Ryosuke Kodama, Tetsuya Ishikawa, N. J. Hartley, Yuichi Inubushi, Bruno Albertazzi, T. Yabuuchi, Toshimasa Matsuoka, Mabel Ruiz-Lopez, Davide Bleiner, Sergei Pikuz, Y Ochante, Makina Yabashi, Norimasa Ozaki, A. Faenov, T. A. Pikuz
Publikováno v:
Journal of Synchrotron Radiation. 24:196-204
Direct metrology of coherent short-wavelength beamlines is important for obtaining operational beam characteristics at the experimental site. However, since beam-time limitation imposes fast metrology procedures, a multi-parametric metrology from as