Zobrazeno 1 - 6
of 6
pro vyhledávání: '"MUKHANOV, Bakhyt K."'
Publikováno v:
PRZEGLĄD ELEKTROTECHNICZNY. 1:131-135
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a8646ea9378f98bc2589d9bad281bd6
https://doi.org/10.15199/48.2017.05.27
https://doi.org/10.15199/48.2017.05.27
Autor:
Zhanar Zh. Omirbekova, Yerbol. Zh. Orakbayev, Madina Alimanova, Mukhanov Bakhyt K, Vladimir V.Pogrebnyak
Publikováno v:
2018 14th International Conference on Electronics Computer and Computation (ICECCO).
the article proves the urgency of studying the models of the uranium mining process by the method of underground leaching, which will allow to evaluate the dynamics of the technological process. More and more attention is paid to the modeling of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::db93af798a70143c76584f86f96966d7
https://doi.org/10.1109/icecco.2018.8634795
https://doi.org/10.1109/icecco.2018.8634795
Autor:
Shynara Jumadilova, Madina Alimanova, Olimzhon A. Baimuratov, Zhanar Zh. Omirbekova, Mukhanov Bakhyt K, Dinara Kozhamzharova
Publikováno v:
FNC/MobiSPC
Productivity of technological processes crucially depends on its continuity and absence of any malfunction. However, operating personnel should be trained for the cases of any emergencies and under conditions as close as it possible to real ones. Tha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a7e701e0d699ad6dcee0a085a30844f3
Publikováno v:
International Journal of Electronics & Telecommunications. Sep2014, Vol. 60 Issue 3, p213-217. 5p.
Publikováno v:
International Journal of Electronics and Telecommunications. 60:213-217
The paper deals with simulation of in-situ uranium leaching technological process, collecting data for forecasting and leaching process control. It provides numerical simulation of uranium in-situ leaching (ISL) using Comsol Multiphysics software pac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c1cb45445c82a3cce460a9e350e4bf1
https://doi.org/10.2478/eletel-2014-0026
https://doi.org/10.2478/eletel-2014-0026
Publikováno v:
Przegląd Elektrotechniczny; 2017, Vol. 93 Issue 5, p129-133, 5p