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Autor:
Bertolotti, J., van Putten, E.G., Akbulut, D., Vos, Willem L., Lagendijk, Aart, Mosk, Allard, Dobisz, Elizabeth A., Eldada, Louay A.
Publikováno v:
Scopus-Elsevier
Nanoengineering: Fabrication, Properties, Optics, and Devices VIII: 21-25 August 2011, San Diego, California, United States
Nanoengineering: Fabrication, Properties, Optics, and Devices VIII
Nanoengineering: Fabrication, Properties, Optics, and Devices VIII: 21-25 August 2011, San Diego, California, United States
Nanoengineering: Fabrication, Properties, Optics, and Devices VIII
Scattering of light is considered a nuisance in microscopy. It limits the penetration depth and strongly deteriorates the achievable resolution. However, by gaining active spatial control over the optical wave front it is possible to manipulate the p