Zobrazeno 1 - 10
of 322
pro vyhledávání: '"MAKRIS, NIKOLAOS"'
Autor:
Tian, Lin, Greer, Hastings, Vialard, François-Xavier, Kwitt, Roland, Estépar, Raúl San José, Rushmore, Richard Jarrett, Makris, Nikolaos, Bouix, Sylvain, Niethammer, Marc
We present an approach to learning regular spatial transformations between image pairs in the context of medical image registration. Contrary to optimization-based registration techniques and many modern learning-based methods, we do not directly pen
Externí odkaz:
http://arxiv.org/abs/2206.05897
Publikováno v:
In Developmental Review December 2024 74
Autor:
Liu, Yang S., Baxi, Madhura, Madan, Christopher R., Zhan, Kevin, Makris, Nikolaos, Rosene, Douglas L., Killiany, Ronald J., Cetin-Karayumak, Suheyla, Pasternak, Ofer, Kubicki, Marek, Cao, Bo
Publikováno v:
In Neurobiology of Aging July 2024 139:73-81
Autor:
Makris, Nikolaos, Bucher, Matthias
A MOSFET threshold voltage extraction method covering the entire range of drain-to-source voltage, from linear to saturation modes, is presented. Transconductance-to-current ratio is obtained from MOSFET transfer characteristics measured at low to hi
Externí odkaz:
http://arxiv.org/abs/2106.00747
Publikováno v:
In Anaesthesia & Intensive Care Medicine March 2024 25(3):219-222
Publikováno v:
In Anaesthesia & Intensive Care Medicine March 2024 25(3):215-218
Publikováno v:
in IEEE Transactions on Electron Devices, vol. 63, no. 11, pp. 4201-4208, Nov. 2016
Variability of low frequency noise (LFN) in MOSFETs is bias-dependent. Moderate- to large-sized transistors commonly used in analog/RF applications show 1/f-like noise spectra, resulting from the superposition of random telegraph noise (RTN). Carrier
Externí odkaz:
http://arxiv.org/abs/2009.00917
A novel method for extracting threshold voltage and substrate effect parameters of MOSFETs with constant current bias at all levels of inversion is presented. This generalized constant-current (GCC) method exploits the charge-based model of MOSFETs t
Externí odkaz:
http://arxiv.org/abs/2008.00576
Autor:
Yfanti, Zafeiroula, Tetradis, Sotirios, Nikitakis, Nikolaos G., Alexiou, Konstantina Eleni, Makris, Nikolaos, Angelopoulos, Christos, Tsiklakis, Kostas
Publikováno v:
In European Journal of Radiology August 2023 165
Publikováno v:
In Cognitive Development October-December 2021 60