Zobrazeno 1 - 9 of 9 pro vyhledávání: '"MAHMOUD BEDROUNI"'
1
A Comparative Study of Un-Doped ZnO and in Doping ZnO Thin Films with Various Concentrations, Subjected to Appropriate UHV Treatment and Characterized by Sensitive Spectroscopy Techniques XPS, AES, Reels and PL
Autor: Kadda Benmohktar Bensassi, Edhawya Hameurlaine, M’hamed Guezzoul, M’hammed Bouslama, Abdellah Ouerdane, Abdelkader Belaidi, Amira Derri, Mahmoud Bedrouni, Abdelhak Baizid, Mahfoud Abdelkrim, Bachir Kharoubi
Publikováno v: Annals of West University of Timisoara - Physics. 64:1-21
In this study, we use complementary and sensitive experimental techniques XPS (X-rays Photoelectron Spectroscopy), AES (Auger Electron Spectroscopy, REELS (Reflection Electron Energy-Loss Spectroscopy) and PL (photoluminescence) to investigate and co
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::dd54222bc5127ceca8ea2e80cafbd5d0
https://doi.org/10.2478/awutp-2022-0001
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2
IMPACT OF INDIUM DOPING ON ZnO THIN FILM SUBJECTED TO APPROPRIATE UHV TREATMENT CHARACTERIZED BY XPS, XRD, AND PL TECHNIQUES
Autor: EDHAWYA HAMEURLAINE, M’HAMED GUEZZOUL, M’HAMMED BOUSLAMA, ABDELLAH OUERDANE, AMIRA DERRI, MAHMOUD BEDROUNI, KADDA BENMOHKTAR BENSASSI, ABDELHAK BAIZID, MAHFOUD ABDELKRIM, BACHIR KHAROUBI
Publikováno v: Surface Review and Letters. 29
The chemical composition, crystalline structure and optical properties of un-doped ZnO (UZO) and indium (6%)-doped ZnO (IZO) thin films grown on Si substrate were studied using X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD) and photo
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3f935214b0a5860b86e038aa7798d9d6
https://doi.org/10.1142/s0218625x22500706
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6
Effect of indium incorporation, stimulated by UHV treatment, on the chemical, optical and electronic properties of ZnO thin film
Autor: Azzeddine Mokadem, Mahfoud Abdelkrim, Yves Caudano, M. Bouslama, M.A. Bezzerrouk, Kada Belmokhtar Bensassi, Mahmoud Bedrouni, M. Bousmaha, M'hamed Guezzoul, Bachir Kharroubi, A. Ouerdane
Publikováno v: Bedrouni, M, Kharroubi, B, Ouerdane, A, Bouslama, M, Guezzoul, M, Caudano, Y, Bensassi, K B, Bousmaha, M, Bezzerrouk, M A, Mokadem, A & Abdelkrim, M 2021, ' Effect of indium incorporation, stimulated by UHV treatment, on the chemical, optical and electronic properties of ZnO thin film ', Optical Materials, vol. 111, 110560 . https://doi.org/10.1016/j.optmat.2020.110560
We show the importance of powerful and complementary analysis techniques XPS (X-rays Photoelectron Spectroscopy), AES (Auger Electron Spectroscopy), and UPS (UV Photoelectron Spectroscopy) associated with PL (Photoluminescence) to investigate the che
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3af83112542c90e290ac0e1224a1485d
https://pure.unamur.be/ws/files/53911942/Revised_Manuscript_unmarked.pdf
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7
First principles calculation of structural, electronic and optical properties of K-doped ZnO
Autor: M'hamed Guezzoul, Halima Benchenane, M. Bouslama, Abdelhak Baizid, Mohamed Salah Halati, A. Ouerdane, Bachir Kharroubi, Azzeddine Mokadem, Mahmoud Bedrouni, Mahfoud Abdelkrim, Kadda Benmokhtar Bensassi
Publikováno v: Computational Condensed Matter. 27:e00558
In this paper, we investigate the effect of Potassium substitution on structural, electronic and optical properties of Zn1-xKxO compounds with (x = 0, 0.0625, 0.125 and 0.25) using Full Potential Linearized Augmented Plane Waves (FP-LAPW). The struct
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c6946c34ab3ea18bdb85fcc43b4eb46e
https://doi.org/10.1016/j.cocom.2021.e00558
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8
Chemical, morphological and optical properties of undoped and Cu-doped ZnO thin films submitted to UHV treatment
Autor: Abdelhak Baizid, Azzeddine Mokadem, Mahfoud Abdelkrim, M'hamed Guezzoul, Kadda Benmokhtar Bensassi, Abdelkader Abdellaoui, A. Ouerdane, Mohamed Salah Halati, Bachir Kharroubi, Mahmoud Bedrouni, M. Bouslama
Publikováno v: Applied Surface Science. 520:146302
The undoped and Cu-doped zinc oxide (UZO and CZO) thin films deposited on Si substrate were treated in the UHV (Ultra-High Vacuum) system using Ar+ sputtering followed by a controlled annealing process at 650 °C. The sensitive experimental technique
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3fa44ec670da7b897d1a52fbd24840a7
https://doi.org/10.1016/j.apsusc.2020.146302
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9
Auger Electron Spectroscopy, Electron Energy Loss Spectroscopy, UV Photoelectron Spectroscopy, and Photoluminescence Characterization of In2O3 Associated to the Theoretical Calculations Based on the Generalized Gradient Approximation and Modified Becke Johnson
Autor: Kheira Hamaida, Mahmoud Bedrouni, Bachir Reguad, Abdelkader Abdellaoui, Azzeddine Mokadem, M’hammed Bouslama, Zakia Lounis, Sébastien Vizzini, M. Ghaffour, Khadidja Boulenouar, Tahar Guenouna
Publikováno v: Journal of Physical Chemistry C
Journal of Physical Chemistry C, 2017, 121 (15), pp.8345-8352. ⟨10.1021/acs.jpcc.6b11823⟩
Journal of Physical Chemistry C, American Chemical Society, 2017, 121 (15), pp.8345-8352. ⟨10.1021/acs.jpcc.6b11823⟩
International audience; The indium oxide In2O3 is among the transparent Conducting oxides (TCO) appropriate for solar cells and optoelectronics. The physical properties are based on the electron distribution on the core levels and in the valence band
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::09a5fa500a584e82ee33075051596c2c
https://hal.science/hal-01694194
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