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Publikováno v:
Extended Abstracts of the Fifth International Workshop on Junction Technology.
A powerful new tool for non-contact analysis of sheet resistance and leakage current in p-n junctions, based on junction photo-voltage analysis of carrier recombination, carrier spreading and loss in the junction, has been developed. The method has b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c119434665ddfabcc5f1bef17e6686fb
https://doi.org/10.1109/iwjt.2005.203876
https://doi.org/10.1109/iwjt.2005.203876
