Zobrazeno 1 - 10
of 45
pro vyhledávání: '"M.J. Zhuo"'
Autor:
Quanxi Jia, Jeffery A. Aguiar, Engang Fu, Blas P. Uberuaga, Pratik P. Dholabhai, Yongqiang Wang, Zhenxing Bi, Amit Misra, M.J. Zhuo
Publikováno v:
Journal of Materials Research. 29:1699-1710
Oxide composites are a class of materials with potential uses for nuclear, space, and coating applications. Exploiting their promise, however, requires a detailed understanding of their interfacial structure and chemistry. Using analytical microscopy
Autor:
Xiangdong Ding, Z. Bi, Y.Q. Wang, Ming Tang, Shijian Zheng, M.J. Zhuo, Engang Fu, Amit Misra, Weizhong Han, Michael Nastasi, Jon K. Baldwin, Hongmei Luo, Y. Fang
Publikováno v:
Acta Materialia. 64:100-112
This study systematically investigates the interface structure of Nb films grown on MgO substrates with different orientations ((1 0 0) and (1 1 1)) by experiments and simulations. X-ray diffraction, transmission electron microscopy (TEM) and high-re
Publikováno v:
Journal of Nuclear Materials. 442:143-147
Radiation damage mechanisms in single crystal SrTiO 3 irradiated with 250 keV Ne ions to a fluence of 1.11 × 10 20 ions/m 2 at both room temperature and 773 K were systematically investigated. The irradiation-induced microstructural evolution was ch
Autor:
Z. Bi, Michael Nastasi, M.J. Zhuo, Amit Misra, Quanxi Jia, Alfredo Caro, Enrique Martínez, Blas P. Uberuaga
Publikováno v:
Materials Research Letters. 1:193-199
Nanomaterials are attracting great interest for many applications, including radiation tolerance. Most work on radiation effects in nanomaterials has focused on the interfaces. Here, we examine the other aspect of nanocomposites, the dual phase natur
Autor:
Robert M. Dickerson, Li Yan, Amit Misra, Q. X. Jia, Blas P. Uberuaga, M. Nastasi, Y.Q. Wang, Engang Fu, M.J. Zhuo
Publikováno v:
Journal of Nuclear Materials. 429:177-184
Epitaxial anatase TiO 2 films with thickness of around 300 nm were deposited on SrTiO 3 and irradiated with 250 keV Ne ions at room temperature. X-ray diffraction, Rutherford backscattering spectrometry, and transmission electron microscopy were used
Autor:
Shixiong Zhang, Rohit P. Prasankumar, Q. X. Jia, Yongqiang Wang, S. T. Picraux, M.J. Zhuo, Li Yan, Jingbo Qi
Publikováno v:
Thin Solid Films. 520:6459-6462
We have grown high quality epitaxial topological insulator Bi 2 Te 3 thin films on silicon (111) substrates by pulsed laser deposition. Systematic structural characterization of the films using X-ray diffraction and transmission electron microscopy h
Autor:
Xiuliang Ma, S. J. Pennycook, Yuan-Hao Wang, Banquan Yang, Matthew F. Chisholm, Zhiqing Yang, M.J. Zhuo
Publikováno v:
Acta Materialia. 60:2637-2646
First-principles calculations, high-resolution transmission electron microscopy (HRTEM) investigations and geometrical phase analysis of lattice strain based on HRTEM images have been carried out on C15 Cr2Nb Laves phase. Asymmetrical nanoscale regio
Autor:
Qiangmin Wei, Y.Q. Wang, Jie Xiong, Amit Misra, M.J. Zhuo, Q. X. Jia, M. Nastasi, Engang Fu, Jon K. Baldwin, G. F. Zou, Lin Shao
Publikováno v:
Applied Physics A. 108:121-126
We studied the effect of irradiation on small angle grain boundaries in mosaic structured Cu thin films. The films showed a decrease in mosaic spread via a narrowing of the full width at half maximum in XRD rocking curves and a smaller minimum yield
Autor:
M.J. Zhuo, Q. X. Jia, Y.Q. Wang, Robert M. Dickerson, Blas P. Uberuaga, Li Yan, Amit Misra, M. Nastasi, Engang Fu, Y.Y. Zhang
Publikováno v:
Scripta Materialia. 65:807-810
The microstructural evolution of Ne-ion-irradiated anatase TiO2/SrTiO3 films was investigated. A defect denuded layer formed in the TiO2 film near the TiO2/SrTiO3 interface after irradiation. The accumulation of defects at the TiO2/SrTiO3 interface l
Publikováno v:
Philosophical Magazine Letters. 90:323-336
Charge-ordered Pr0.5Ca0.5MnO3 (PCMO) thin films epitaxially grown on SrTiO3 (100) substrates were prepared by a two-step growth technique which resulted in a 10 nm thick first layer and a 70 nm thick main layer. The dislocations in the as-received fi