Zobrazeno 1 - 10
of 33
pro vyhledávání: '"M.H.F. Overwijk"'
Autor:
D Reefman, M.H.F Overwijk
Publikováno v:
Micron. 31:325-331
In the present paper, we investigate the performance of maximum-entropy deconvolution, in removing the instrumental response function from electron energy-loss spectra. To this end we make use of spectra acquired from the carbon K-edge in graphite fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a84fa3fb3ed602d4a224712dd24ad48d
https://doi.org/10.1016/s0968-4328(99)00111-0
https://doi.org/10.1016/s0968-4328(99)00111-0
Publikováno v:
Ultramicroscopy. 77:1-11
A new method for off-axis holography is presented with a beam splitter crystal in the illumination system of the electron microscope and a biprism in the selected area aperture plane. The method allows high resolution off-axis holography, up to the i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::608031f30406092a16c6e14dac23e10f
https://doi.org/10.1016/s0304-3991(99)00008-x
https://doi.org/10.1016/s0304-3991(99)00008-x
Publikováno v:
Ultramicroscopy. 67:163-170
Due to the influence of three-fold astigmatism, the spatial resolution obtained on many modern high-resolution transmission electron microscopes is often not better than 0.2 nm. Although beam tilt can mask the effect of three-fold astigmatism when im
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e40bd2c03885f98be99b68b00e60fb34
https://doi.org/10.1016/s0304-3991(96)00096-4
https://doi.org/10.1016/s0304-3991(96)00096-4
Publikováno v:
Ultramicroscopy. 64:249-264
Phase-retrieval methods in high-resolution transmission electron microscopy allow one to determine the wave function at the exit-plane of the object (the exit-plane wave function). Viable methods for the retrieval of the exit-plane wave function are
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8670d9b261d866ca120bcec1bb8b6e11
https://doi.org/10.1016/0304-3991(96)00022-8
https://doi.org/10.1016/0304-3991(96)00022-8
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 96:257-260
We compare the gettering efficiency of C, O and He implantation into Cz-grown silicon. After the getter implantation, with a projected range of 1.2 μm, we introduce a controlled amount of either Fe or Cu through low-energy implantation. Subsequently
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ee7a496f860939428e7a7aacaf18f331
https://doi.org/10.1016/0168-583x(94)00495-1
https://doi.org/10.1016/0168-583x(94)00495-1
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 91:322-326
The incorporation of Nd ions in SrTiO 3 can be studied conveniently by means of the photoluminescence spectrum originating from the Nd 3+ ion. We have used Nd 3+ spectra obtained at liquid-helium temperatures, to study the annealing behavior of ion i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2993cc138c372ea0810bab8330a2f99a
https://doi.org/10.1016/0168-583x(94)96239-1
https://doi.org/10.1016/0168-583x(94)96239-1
Autor:
M.H.F. Overwijk, F. C. van den Heuvel
Publikováno v:
Journal of Applied Physics. 74:1762-1769
A time‐dependent model for focused‐ion‐beam‐induced deposition is presented which explicitly takes the scanning strategy of the beam during deposition into account. The model differentiates between the contribution of the beam center and that
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d216e6b1ad8b1f1fbe5436b076d6cdcf
https://doi.org/10.1063/1.354805
https://doi.org/10.1063/1.354805
Publikováno v:
Microelectronic Engineering. 21:209-212
The modification or repair of integrated circuits by means of focused-ion-beam-induced deposition occasionally fails due to interruptions in the deposited metal line at steps on the surface. In this paper we study the parameters which determine the q
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2a2785e6a69e20d0af3514b1994079ec
https://doi.org/10.1016/0167-9317(93)90057-c
https://doi.org/10.1016/0167-9317(93)90057-c
Autor:
M.H.F. Overwijk, F.C. van den Heuvel
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :1324-1327
A time-dependent model for focused-ion-beam-induced metal deposition is presented which describes the competition between gas adsorption and ion-assisted gas removal, and the competition between metal deposition and sputtering. The model contains all
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f29b584f246070ad65a7658ef54ef0a
https://doi.org/10.1016/0168-583x(93)90792-5
https://doi.org/10.1016/0168-583x(93)90792-5
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :1185-1188
Optical spectroscopy is employed to study the incorporation of Nd implanted in SrTiO 3 . The photoluminescence of the Nd 3+ ion enables us to monitor the reconstruction of the host lattice. We have implanted 1 mol% Nd in SrTiO 3 , and studied the pho
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c6a204af96203d7d3dce93f57cd9737e
https://doi.org/10.1016/0168-583x(93)90762-u
https://doi.org/10.1016/0168-583x(93)90762-u