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pro vyhledávání: '"M.H. Jing"'
Akademický článek
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Publikováno v:
Data Storage
The computer industry has entered a stage of unprecedented improvement in CPU performance. However, the speed of file system management of huge information is commonly considered as the main factor that affects the computer performance; for example,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d52fbac5d81c4c3e23e4846e2f39bc3a
https://doi.org/10.5772/8870
https://doi.org/10.5772/8870
Publikováno v:
VLSI
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4b0756f2e3d13cea84f639ad110f6742
https://doi.org/10.5772/8244
https://doi.org/10.5772/8244
Autor:
M.H. Jing, L.J.C. Woolliscroft
Publikováno v:
IFAC Proceedings Volumes. 25:485-490
A small fault tolerant system is described which has been designed as an instrument controller for space applications. It uses three processor modules and some limited shared resources. Central to the operation of this system is the manner in which t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::995a26623a10c27398cc593d58fef30f
https://doi.org/10.1016/s1474-6670(17)50953-2
https://doi.org/10.1016/s1474-6670(17)50953-2
Publikováno v:
2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
CMOS chips are scaled to smaller geometries, the interconnects play an increasing role in the overall chip performance. This paper presents an integrated process for yield enhancement strategy to overcome a so-called "cosmetic defects" in 130- and 90
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4af2dda9432051c12357ad0f2682ac2c
https://doi.org/10.1109/ipfa.2007.4378097
https://doi.org/10.1109/ipfa.2007.4378097
Publikováno v:
2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
This investigation considers in detail a defect called "silicon substrate damaged defects" and also introduces these defects' forming mechanisms and their root causes. These defects are likely to become increasing important in the future of deep-sub
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4703c54c668522b0944ae1bde7315d55
https://doi.org/10.1109/ipfa.2007.4378101
https://doi.org/10.1109/ipfa.2007.4378101
Publikováno v:
2007 IEEE Conference on Electron Devices and Solid-State Circuits.
For the manufacturing of submicron or deep submicron ULSIs, it is important to completely suppress particles and contamination created on the silicon wafer surface. The time and logistics associated with particle testing on product have driven manufa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::14fbe08f1b35bd39ed1e4c6fac60c99b
https://doi.org/10.1109/edssc.2007.4450184
https://doi.org/10.1109/edssc.2007.4450184
Publikováno v:
2007 IEEE Conference on Electron Devices and Solid-State Circuits.
As semiconductor substrate wafer size and the manufacturing process steps are continuous to increase, several reliability concerns will become more important. This investigation considers in detail a defect called "silicon substrate damaged defects"
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::240526dbaaf242077514da5b5bfc542f
https://doi.org/10.1109/edssc.2007.4450183
https://doi.org/10.1109/edssc.2007.4450183
Publikováno v:
APCCAS
The mathematics of finite field has been widely applied on the design of core modules for cryptography systems. This paper presents one of the module designs of a VLSI computer aided design (CAD) system to bridge the gap between the finite field and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0626a1884854ff4715ebc833b085027
https://doi.org/10.1109/apccas.2006.342460
https://doi.org/10.1109/apccas.2006.342460
Publikováno v:
The 2004 IEEE Asia-Pacific Conference on Circuits and Systems, 2004. Proceedings..
A set of high speed RS code and diversified AES IPS is integrated as a core to provide a solution to secure the storage systems on network. As a result, it is dificult to develop such complicated system. During development, a comprehensive environmen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e33808cfe4b6ac9ebec8650fc4b69dba
https://doi.org/10.1109/apccas.2004.1413016
https://doi.org/10.1109/apccas.2004.1413016